DOUBLE CRYSTAL X-RAY-ANALYSIS OF PHOSPHORUS PRECIPITATION IN SUPERSATURATED SI-P SOLID-SOLUTIONS

被引：8

作者：

SERVIDORI, M ^{[1
]}

MONTE, CD ^{[1
]}

ZINI, Q ^{[1
]}

机构：

[1] UNIV BOLOGNA,IST FIS,I-40126 BOLOGNA,ITALY

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1983年 / 80卷 / 01期

关键词：

D O I：

10.1002/pssa.2210800131

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：277 / 285

页数：9

共 23 条

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[10] APPLICATION OF A PRECISE DOUBLE X-RAY SPECTROMETER FOR ACCURATE LATTICE-PARAMETER DETERMINATION [J].

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