PIXE ANALYSIS OF COMPOUND MATERIALS

被引：2

作者：

KALISH, R ^{[1
]}

BAHIR, G ^{[1
]}

机构：

[1] TECHNION ISRAEL INST TECHNOL,DEPT PHYS,HAIFA,ISRAEL

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)91014-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：415 / 419

页数：5

共 11 条

[1]

ANDERSEN JV, 1976, NUCL INSTR METH, V132, P176

[2] COINCIDENCE MEASUREMENTS BETWEEN SCATTERED PARTICLES AND X-RAYS TO OBTAIN HIGH DEPTH AND MASS RESOLUTION [J].

BAHIR, G ;

KALISH, R ;

TSERRUYA, I .

NUCLEAR INSTRUMENTS & METHODS, 1980, 168 (1-3) :227-232

[3] DAMAGE AND LATTICE LOCATION STUDIES IN HG IMPLANTED HG1-XCDXTE [J].

BAHIR, G ;

BERNSTEIN, T ;

KALISH, R .

RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1980, 48 (1-4) :247-252

[4]

BAHIR G, 1983, J APPL PHYS, V54, P3128

[5]

BARRET JH, 1971, PHYS REV B, V1, P1527

[6] COMBINED USE OF HE BACKSCATTERING AND HE-INDUCED X-RAYS IN STUDY OF ANODICALLY GROWN OXIDE-FILMS ON GAAS [J].

FELDMAN, LC ;

POATE, JM ;

ERMANIS, F ;

SCHWARTZ, B .

THIN SOLID FILMS, 1973, 19 (01) :81-89

[7]

FELDMAN LC, 1976, ION BEAM SURFACE LAY, P735

[8]

GEMMEL DS, 1972, PHYS REV B, V6, P158

[9] USE OF ION-BEAM TECHNIQUES TO CHARACTERIZE THIN PLASMA GROWN GAAS AND GAALAS OXIDE-FILMS [J].

KAUFFMAN, RL ;

FELDMAN, LC ;

CHANG, RPH .

NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :619-622

[10]

MAYER JW, 1977, ION BEAM HDB MATERIA

← 1 2 →