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REDISTRIBUTION OF IMPLANTED PHOSPHORUS AFTER PLATINUM SILICIDE FORMATION AND THE CHARACTERISTICS OF SCHOTTKY-BARRIER DIODES
被引:30
作者
:
KIKUCHI, A
论文数:
0
引用数:
0
h-index:
0
KIKUCHI, A
SUGAKI, S
论文数:
0
引用数:
0
h-index:
0
SUGAKI, S
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1982年
/ 53卷
/ 05期
关键词
:
D O I
:
10.1063/1.331155
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:3690 / 3693
页数:4
相关论文
共 5 条
[1]
ELECTRON-TRANSPORT ACROSS ALUMINUM ULTRATHIN SILICON-OXIDE PHOSPHORUS IMPLANTED SILICON BARRIERS
KIKUCHI, A
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
KIKUCHI, A
YAMAMOTO, H
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
YAMAMOTO, H
IWATA, S
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
IWATA, S
IKEDA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
IKEDA, T
NAKATA, K
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
NAKATA, K
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(09)
: 4913
-
4918
[2]
BEAM-LEAD TECHNOLOGY
LEPSELTE.MP
论文数:
0
引用数:
0
h-index:
0
LEPSELTE.MP
[J].
BELL SYSTEM TECHNICAL JOURNAL,
1966,
45
(02):
: 233
-
&
[3]
ELECTRICAL-PROPERTIES OF PLATINUM-SILICON CONTACT ANNEALED IN AN H-2 AMBIENT
MUTA, H
论文数:
0
引用数:
0
h-index:
0
MUTA, H
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1978,
17
(06)
: 1089
-
1098
[4]
SZE SM, 1965, PHYSICS SEMICONDUCTO
[5]
REDISTRIBUTION OF IMPLANTED DOPANTS AFTER METAL-SILICIDE FORMATION
WITTMER, M
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
WITTMER, M
SEIDEL, TE
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
SEIDEL, TE
[J].
JOURNAL OF APPLIED PHYSICS,
1978,
49
(12)
: 5827
-
5834
←
1
→
共 5 条
[1]
ELECTRON-TRANSPORT ACROSS ALUMINUM ULTRATHIN SILICON-OXIDE PHOSPHORUS IMPLANTED SILICON BARRIERS
KIKUCHI, A
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
KIKUCHI, A
YAMAMOTO, H
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
YAMAMOTO, H
IWATA, S
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
IWATA, S
IKEDA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
IKEDA, T
NAKATA, K
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
NAKATA, K
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(09)
: 4913
-
4918
[2]
BEAM-LEAD TECHNOLOGY
LEPSELTE.MP
论文数:
0
引用数:
0
h-index:
0
LEPSELTE.MP
[J].
BELL SYSTEM TECHNICAL JOURNAL,
1966,
45
(02):
: 233
-
&
[3]
ELECTRICAL-PROPERTIES OF PLATINUM-SILICON CONTACT ANNEALED IN AN H-2 AMBIENT
MUTA, H
论文数:
0
引用数:
0
h-index:
0
MUTA, H
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1978,
17
(06)
: 1089
-
1098
[4]
SZE SM, 1965, PHYSICS SEMICONDUCTO
[5]
REDISTRIBUTION OF IMPLANTED DOPANTS AFTER METAL-SILICIDE FORMATION
WITTMER, M
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
WITTMER, M
SEIDEL, TE
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
SEIDEL, TE
[J].
JOURNAL OF APPLIED PHYSICS,
1978,
49
(12)
: 5827
-
5834
←
1
→