学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
SATURATION OF SI ACTIVATION AT HIGH DOPING LEVELS IN GAAS
被引:22
作者
:
BANWELL, TC
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360
ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360
BANWELL, TC
[
1
]
MAENPAA, M
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360
ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360
MAENPAA, M
[
1
]
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360
ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360
NICOLET, MA
[
1
]
TANDON, JL
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360
ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360
TANDON, JL
[
1
]
机构
:
[1]
ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360
来源
:
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
|
1983年
/ 44卷
/ 06期
关键词
:
D O I
:
10.1016/0022-3697(83)90038-0
中图分类号
:
O6 [化学];
学科分类号
:
0703 ;
摘要
:
引用
收藏
页码:507 / 514
页数:8
相关论文
共 24 条
[1]
EVIDENCE FOR EXISTENCE OF HIGH CONCENTRATIONS OF LATTICE DEFECTS IN GAAS
BLANC, J
论文数:
0
引用数:
0
h-index:
0
BLANC, J
WEISBERG, LR
论文数:
0
引用数:
0
h-index:
0
WEISBERG, LR
BUBE, RH
论文数:
0
引用数:
0
h-index:
0
BUBE, RH
[J].
PHYSICAL REVIEW LETTERS,
1962,
9
(06)
: 252
-
&
[2]
BROUWER G, 1954, PHILIPS RES REP, V9, P366
[3]
GIBBONS JF, 1975, PROJECTED RANGE STAT
[4]
EPITAXIAL REGROWTH OF THIN AMORPHOUS GAAS-LAYERS
GRIMALDI, MG
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
GRIMALDI, MG
PAINE, BM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
PAINE, BM
MAENPAA, M
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
MAENPAA, M
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
NICOLET, MA
SADANA, DK
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
SADANA, DK
[J].
APPLIED PHYSICS LETTERS,
1981,
39
(01)
: 70
-
72
[5]
HIGH-PURITY SEMI-INSULATING GAAS MATERIAL FOR MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS
HOBGOOD, HM
论文数:
0
引用数:
0
h-index:
0
HOBGOOD, HM
ELDRIDGE, GW
论文数:
0
引用数:
0
h-index:
0
ELDRIDGE, GW
BARRETT, DL
论文数:
0
引用数:
0
h-index:
0
BARRETT, DL
THOMAS, RN
论文数:
0
引用数:
0
h-index:
0
THOMAS, RN
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(02)
: 140
-
149
[6]
OPTICAL PROPERTIES OF N-TYPE GAAS .3. RELATIVE BAND-EDGE RECOMBINATION EFFICIENCY OF SI- AND TE-DOPED CRYSTALS BEFORE AND AFTER HEAT TREATMENT
HWANG, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Telephone Laboratories, Incorporated, Murray Hill
HWANG, CJ
[J].
JOURNAL OF APPLIED PHYSICS,
1969,
40
(11)
: 4591
-
&
[7]
INADA T, 1978, 1ST P INT C ION BEAM, P401
[8]
DETERMINATION OF FERMI-LEVEL EFFECT ON SI-SITE DISTRIBUTION IN GAAS-SI
KUNG, JK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
KUNG, JK
SPITZER, WG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
SPITZER, WG
[J].
JOURNAL OF APPLIED PHYSICS,
1974,
45
(05)
: 2254
-
2257
[9]
SI-DEFECT CONCENTRATIONS IN HEAVILY SI-DOPED GAAS - CHANGES INDUCED BY ANNEALING
KUNG, JK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
KUNG, JK
SPITZER, WG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
SPITZER, WG
[J].
JOURNAL OF APPLIED PHYSICS,
1974,
45
(10)
: 4477
-
4486
[10]
EFFECTS OF ANNEALING ON CARRIER CONCENTRATION OF HEAVILY SI-DOPED GAAS
KUNG, JK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
KUNG, JK
SPITZER, WG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
SPITZER, WG
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(02)
: 912
-
914
←
1
2
3
→
共 24 条
[1]
EVIDENCE FOR EXISTENCE OF HIGH CONCENTRATIONS OF LATTICE DEFECTS IN GAAS
BLANC, J
论文数:
0
引用数:
0
h-index:
0
BLANC, J
WEISBERG, LR
论文数:
0
引用数:
0
h-index:
0
WEISBERG, LR
BUBE, RH
论文数:
0
引用数:
0
h-index:
0
BUBE, RH
[J].
PHYSICAL REVIEW LETTERS,
1962,
9
(06)
: 252
-
&
[2]
BROUWER G, 1954, PHILIPS RES REP, V9, P366
[3]
GIBBONS JF, 1975, PROJECTED RANGE STAT
[4]
EPITAXIAL REGROWTH OF THIN AMORPHOUS GAAS-LAYERS
GRIMALDI, MG
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
GRIMALDI, MG
PAINE, BM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
PAINE, BM
MAENPAA, M
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
MAENPAA, M
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
NICOLET, MA
SADANA, DK
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
SADANA, DK
[J].
APPLIED PHYSICS LETTERS,
1981,
39
(01)
: 70
-
72
[5]
HIGH-PURITY SEMI-INSULATING GAAS MATERIAL FOR MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS
HOBGOOD, HM
论文数:
0
引用数:
0
h-index:
0
HOBGOOD, HM
ELDRIDGE, GW
论文数:
0
引用数:
0
h-index:
0
ELDRIDGE, GW
BARRETT, DL
论文数:
0
引用数:
0
h-index:
0
BARRETT, DL
THOMAS, RN
论文数:
0
引用数:
0
h-index:
0
THOMAS, RN
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(02)
: 140
-
149
[6]
OPTICAL PROPERTIES OF N-TYPE GAAS .3. RELATIVE BAND-EDGE RECOMBINATION EFFICIENCY OF SI- AND TE-DOPED CRYSTALS BEFORE AND AFTER HEAT TREATMENT
HWANG, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Telephone Laboratories, Incorporated, Murray Hill
HWANG, CJ
[J].
JOURNAL OF APPLIED PHYSICS,
1969,
40
(11)
: 4591
-
&
[7]
INADA T, 1978, 1ST P INT C ION BEAM, P401
[8]
DETERMINATION OF FERMI-LEVEL EFFECT ON SI-SITE DISTRIBUTION IN GAAS-SI
KUNG, JK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
KUNG, JK
SPITZER, WG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
SPITZER, WG
[J].
JOURNAL OF APPLIED PHYSICS,
1974,
45
(05)
: 2254
-
2257
[9]
SI-DEFECT CONCENTRATIONS IN HEAVILY SI-DOPED GAAS - CHANGES INDUCED BY ANNEALING
KUNG, JK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
KUNG, JK
SPITZER, WG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
SPITZER, WG
[J].
JOURNAL OF APPLIED PHYSICS,
1974,
45
(10)
: 4477
-
4486
[10]
EFFECTS OF ANNEALING ON CARRIER CONCENTRATION OF HEAVILY SI-DOPED GAAS
KUNG, JK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
KUNG, JK
SPITZER, WG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
SPITZER, WG
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(02)
: 912
-
914
←
1
2
3
→