INTERFERENCE EFFECTS IN THE RAMAN-SCATTERING INTENSITY FROM THIN-FILMS

被引:37
作者
RAMSTEINER, M
WILD, C
WAGNER, J
机构
来源
APPLIED OPTICS | 1989年 / 28卷 / 18期
关键词
D O I
10.1364/AO.28.004017
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
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页码:4017 / 4023
页数:7
相关论文
共 21 条
[1]  
ANGUS JC, 1986, PLASMA DEPOSITED THI, pCH4
[2]   DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV [J].
ASPNES, DE ;
STUDNA, AA .
PHYSICAL REVIEW B, 1983, 27 (02) :985-1009
[3]   RF-PLASMA DEPOSITED AMORPHOUS HYDROGENATED HARD CARBON THIN-FILMS - PREPARATION, PROPERTIES, AND APPLICATIONS [J].
BUBENZER, A ;
DISCHLER, B ;
BRANDT, G ;
KOIDL, P .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (08) :4590-4595
[4]   EXACT EXPRESSIONS FOR CALCULATING THIN-FILM ABSORPTION-COEFFICIENTS FROM LASER CALORIMETRIC DATA [J].
BUBENZER, A ;
KOIDL, P .
APPLIED OPTICS, 1984, 23 (17) :2886-2891
[5]  
Cardoso M, 1982, LIGHT SCATTERING SOL, P19
[6]   INTERFERENCE ENHANCED RAMAN-SCATTERING FROM VERY THIN ABSORBING FILMS [J].
CONNELL, GAN ;
NEMANICH, RJ ;
TSAI, CC .
APPLIED PHYSICS LETTERS, 1980, 36 (01) :31-33
[7]   INTERFERENCE-ENHANCED RAMAN-SCATTERING FROM TIO2/SIO2 MULTILAYERS - MEASUREMENT AND THEORY [J].
CRAIG, RA ;
EXARHOS, GJ ;
PAWLEWICZ, WT ;
WILLIFORD, RE .
APPLIED OPTICS, 1987, 26 (19) :4193-4197
[8]   FRICTIONAL-PROPERTIES OF DIAMOND-LIKE CARBON LAYERS [J].
ENKE, K ;
DIMIGEN, H ;
HUBSCH, H .
APPLIED PHYSICS LETTERS, 1980, 36 (04) :291-292
[9]   INVESTIGATION OF HYDROCARBON-PLASMA-GENERATED CARBON-FILMS BY ELECTRON-ENERGY-LOSS SPECTROSCOPY [J].
FINK, J ;
MULLERHEINZERLING, T ;
PFLUGER, J ;
SCHEERER, B ;
DISCHLER, B ;
KOIDL, P ;
BUBENZER, A ;
SAH, RE .
PHYSICAL REVIEW B, 1984, 30 (08) :4713-4718
[10]   REDUCTION OF SUBSTRATE INTERFERENCE IN RAMAN-SPECTROSCOPY OF SUB-MICRON TITANIA COATINGS [J].
HSU, LS ;
SHE, CY ;
EXARHOS, GJ .
APPLIED OPTICS, 1984, 23 (18) :3049-3051