ACCURATE INTERBAND-AUGER-RECOMBINATION RATES IN SILICON

被引:54
作者
LAKS, DB [1 ]
NEUMARK, GF [1 ]
PANTELIDES, ST [1 ]
机构
[1] IBM CORP,DIV RES,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源
PHYSICAL REVIEW B | 1990年 / 42卷 / 08期
关键词
D O I
10.1103/PhysRevB.42.5176
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Band-to-band Auger recombination is the dominant recombination mechanism in silicon at high carrier concentrations. Previous calculations found Auger rates too small to account for experiment. These calculations, however, contained uncontrolled approximations. We calculate accurate Auger recombination rates in both n-type and p-type silicon, avoiding approximations made in all prior Auger work. Our calculations show that Auger recombination is an order of magnitude stronger than previously thought. Our results for n-type Si agree well with experimental lifetimes. In contrast, a phonon-assisted mechanism is indicated for p-type Si. This conclusion can be understood based on details of the band structure. © 1990 The American Physical Society.
引用
收藏
页码:5176 / 5185
页数:10
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