CORRELATION OF THE STRUCTURE WITH ELECTRICAL AND OPTICAL-PROPERTIES OF THIN TIN FILMS

被引：12

作者：

ABOUSAIF, EA ^{[1
]}

MOHAMED, AA ^{[1
]}

ELKHODARY, MG ^{[1
]}

机构：

[1] AIN SHAMS UNIV,FAC SCI,DEPT PHYS,CAIRO,EGYPT

来源：

THIN SOLID FILMS | 1982年 / 94卷 / 02期

关键词：

D O I：

10.1016/0040-6090(82)90505-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：133 / 142

页数：10

共 25 条

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[13]

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[18] TEMPERATURE-COEFFICIENT OF RESISTIVITY OF POLYCRYSTALLINE RADIO-FREQUENCY SPUTTERED ALUMINUM FILMS [J].

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