MORE ACCURATE EXPRESSION FOR NOISE FIGURE OF TRANSISTORS

被引：3

作者：

VANDERZIEL, A

CRUZEMERIC, JA

LIVINGSTONE, RD

MALPASS, JC

MCNAMARA, DA

机构：

[1] UNIV MINNESOTA,ELECT ENGN DEPT,MINNEAPOLIS,MN 55455

[2] UNIV FLORIDA,ELECT ENGN DEPT,GAINESVILLE,FL 32611

来源：

SOLID-STATE ELECTRONICS | 1976年 / 19卷 / 02期

关键词：

D O I：

10.1016/0038-1101(76)90094-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：149 / 151

页数：3

共 9 条

[1] NOISE PERFORMANCE OF MICROWAVE TRANSISTORS [J].

FUKUI, H .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (03) :329-&

[2] AVAILABLE POWER GAIN NOISE FIGURE AND NOISE MEASURE OF 2-PORTS AND THEIR GRAPHICAL REPRESENTATIONS [J].

FUKUI, H .

IEEE TRANSACTIONS ON CIRCUIT THEORY, 1966, CT13 (02) :137-&

[3] SIMPLIFIED APPROACH TO NOISE IN MICROWAVE TRANSISTORS [J].

MALAVIYA, SD ;

VANDERZI.A .

SOLID-STATE ELECTRONICS, 1970, 13 (12) :1511-&

[4] THEORY OF INTERMEDIATE AND HIGH INJECTION NOISE IN TRANSISTORS [J].

MIN, HS ;

VANVLIET, KM .

SOLID-STATE ELECTRONICS, 1974, 17 (03) :285-300

[5] BEHAVIOR OF NOISE FIGURE IN JUNCTION TRANSISTORS [J].

NIELSEN, EG .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1957, 45 (07) :957-963

[6]

TONG HA, 1968, IEEE T ELECTRON DEVI, V15, P307

[7]

van der Ziel A., 1970, Noise Sources Characterization Measurement

[8]

van der Ziel A., 1959, Fluctuation Phenomena in Semiconductors

[9]

VANDERZIEL A, 1975, SOLID STATE PHYSICAL

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