NUCLEAR MICROPROBES AND THEIR SIGNIFICANCE FOR TRACE-ELEMENT ANALYSIS

被引:9
作者
TRAXEL, K
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D O I
10.1016/0168-9002(88)90580-3
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:567 / 578
页数:12
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共 71 条
[1]   SUPERCOLLIMATION OF NEGATIVE ION BEAMS WITH APERTURES [J].
ARMSTRONG, DD ;
WEGNER, HE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (01) :40-+
[2]   MINIATURE ELECTROSTATIC LENS FOR FORMING MEV MILLIBEAMS [J].
AUGUSTYNIAK, WM ;
BETTERIDGE, D ;
BROWN, WL .
NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :669-673
[3]   PARTITIONING OF ZR AND NB BETWEEN COEXISTING OPAQUE PHASES IN LUNAR ROCKS - DETERMINED BY QUANTITATIVE PROTON MICROPROBE ANALYSIS [J].
BLANK, H ;
ELGORESY, A ;
JANICKE, J ;
NOBILING, R ;
TRAXEL, K .
EARTH AND PLANETARY SCIENCE LETTERS, 1984, 68 (01) :19-33
[4]  
BROWN KL, SLAC91REV2UC28
[5]   THE USE OF THE PIXE TECHNIQUE WITH NUCLEAR MICROPROBES [J].
COOKSON, JA .
NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3) :115-124
[6]   PRODUCTION AND USE OF A NUCLEAR MICROPROBE OF IONS AT MEV ENERGIES [J].
COOKSON, JA .
NUCLEAR INSTRUMENTS & METHODS, 1979, 165 (03) :477-508
[7]  
Coote G. E., 1981, NZ J ARCHAEOLOGY, V3, P21
[8]   MULTIPLE SCATTERING CORRECTIONS FOR COLLIMATING SLITS [J].
COURANT, ED .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1951, 22 (12) :1003-1005
[9]   A NEW CONCEPT FOR IMPROVED ION AND ELECTRON LENSES - ABERRATION CORRECTED SYSTEMS OF PLANAR ELECTROSTATIC DEFLECTION ELEMENTS [J].
DALGLISH, RL ;
WINCHESTER, T ;
SMITH, AM .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :7-10
[10]   CORRECTED ELECTROSTATIC LENS SYSTEMS FOR ION-BEAMS [J].
DALGLISH, RL .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3) :191-198