A NEW APPROACH TO THE DETERMINATION OF MS-BARRIER HEIGHTS FROM PHOTOELECTRIC DATA AND OR AN ALTERNATIVE WAY TO DETERMINE THE VALUE OF THE RICHARDSON CONSTANT

被引：4

作者：

PIRES, JD

DONOVAL, D

TOVE, PA

机构：

来源：

关键词：

D O I：

10.1016/0038-1101(82)90021-1

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：989 / 993

页数：5

共 11 条

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LEPSELTER, MP .

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RHODERICK, EH .

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KAO, CW ;

ANDERSON, CL ;

CROWELL, CR .

[6]

MEAD CA, 1966, SOLID ST ELECTRON, V9

[7]

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[8]

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[9]

PIRES JD, 1977, UPTEC7730R UPPS U I

[10]

PIRES JD, 1980, THESIS U UPPSALA