NONCONTACT HIGH-SPEED WAVEFORM MEASUREMENTS WITH THE PICOSECOND PHOTOELECTRON SCANNING ELECTRON-MICROSCOPE

被引：30

作者：

MAY, PG

HALBOUT, JM

CHIU, GLT

机构：

[1] IBM, Yorktown Heights, NY, USA, IBM, Yorktown Heights, NY, USA

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1988年 / 24卷 / 02期

关键词：

D O I：

10.1109/3.118

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：234 / 239

页数：6

共 22 条

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[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1979, 15 (10) : 1176 - 1180
[5] HALBOUT JM, 1988 ISSCC
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[J]. APPLIED PHYSICS LETTERS, 1986, 48 (16) : 1066 - 1068
[7] GENERATION AND MEASUREMENT OF SUBPICOSECOND ELECTRON-BEAM PULSES
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URA, K
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (05) : 624 - 628
[8] PRACTICAL LASER-ACTIVATED PHOTOEMISSIVE ELECTRON SOURCE
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[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (04) : 560 - 562
[9] HIGH-SPEED ELECTRICAL SAMPLING BY FS PHOTOEMISSION
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LIN, PSD
[J]. APPLIED PHYSICS LETTERS, 1986, 49 (06) : 357 - 359
[10] LASER PHOTOELECTRON SOURCES OF HIGH APPARENT BRIGHTNESS
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[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1984, 20 (02) : 103 - 105

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