CRITICAL LAYER THICKNESSES FOR INCLINED DISLOCATION STABILITY IN MULTILAYER STRUCTURES

被引：33

作者：

FENG, XX

HIRTH, JP

机构：

[1] Department of Mechanical and Materials Engineering, Washington State University, Pullman

来源：

JOURNAL OF APPLIED PHYSICS | 1992年 / 72卷 / 04期

关键词：

D O I：

10.1063/1.351750

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The critical thickness for stability of dislocations on glide planes inclined to the interfaces in a strained-layer structure is derived. Results are presented for both a single embedded layer and a multilayer structure (superlattice). Both the equilibrium array for the complete removal of coherency strain and less-dense arrays are considered. Results are compared with the previous treatment of Lomer misfit dislocations and with other treatments of multiple dislocation arrays.

引用

页码：1386 / 1394

页数：9

共 28 条

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