CRITICAL LAYER THICKNESSES FOR INCLINED DISLOCATION STABILITY IN MULTILAYER STRUCTURES

被引:33
作者
FENG, XX
HIRTH, JP
机构
[1] Department of Mechanical and Materials Engineering, Washington State University, Pullman
关键词
D O I
10.1063/1.351750
中图分类号
O59 [应用物理学];
学科分类号
摘要
The critical thickness for stability of dislocations on glide planes inclined to the interfaces in a strained-layer structure is derived. Results are presented for both a single embedded layer and a multilayer structure (superlattice). Both the equilibrium array for the complete removal of coherency strain and less-dense arrays are considered. Results are compared with the previous treatment of Lomer misfit dislocations and with other treatments of multiple dislocation arrays.
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页码:1386 / 1394
页数:9
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