EPITAXIAL YTTRIA-STABILIZED ZIRCONIA ON (1102)SAPPHIRE FOR YB2CU3O7-DELTA THIN-FILMS

被引:74
作者
WU, XD
MUENCHAUSEN, RE
NOGAR, NS
PIQUE, A
EDWARDS, R
WILKENS, B
RAVI, TS
HWANG, DM
CHEN, CY
机构
[1] UNIV CALIF LOS ALAMOS SCI LAB,ERDC,DIV CHEM & LASER SCI,LOS ALAMOS,NM 87545
[2] NEOCERA INC,NEW BRUNSWICK,NJ 08901
[3] BELLCORE,RED BANK,NJ 07701
关键词
D O I
10.1063/1.104669
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial yttria-stabilized zirconia (YSZ) films were deposited on (1102BAR1) sapphire by pulsed laser deposition. The films are formed in a cubic phase with the a axis normal to the substrate surface. Ion beam (2.8 MeV He++) channeling measurements shows that the YSZ films are highly crystalline with a channeling minimum yield of 8%. The epitaxial relationship between the film and substrate is further confirmed by a cross-section transmission electron microscopy study. Epitaxial YBa2Cu3O7-delta thin films deposited on YSZ/sapphire have T(c) and J(c) of up to 89 K and 1 x 10(6) A/cm2 at 77 K, respectively.
引用
收藏
页码:304 / 306
页数:3
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