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IMPROVEMENT IN THE SURFACE PHOTOVOLTAGE METHOD OF DETERMINING DIFFUSION LENGTH IN THIN-FILMS OF HYDROGENATED AMORPHOUS-SILICON
被引:11
作者
:
MOORE, AR
论文数:
0
引用数:
0
h-index:
0
MOORE, AR
LIN, HS
论文数:
0
引用数:
0
h-index:
0
LIN, HS
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1987年
/ 61卷
/ 10期
关键词
:
D O I
:
10.1063/1.338345
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:4816 / 4819
页数:4
相关论文
共 8 条
[1]
DIFFUSION LENGTH OF HOLES IN A-SI-H BY THE SURFACE PHOTO-VOLTAGE METHOD
DRESNER, J
论文数:
0
引用数:
0
h-index:
0
DRESNER, J
SZOSTAK, DJ
论文数:
0
引用数:
0
h-index:
0
SZOSTAK, DJ
GOLDSTEIN, B
论文数:
0
引用数:
0
h-index:
0
GOLDSTEIN, B
[J].
APPLIED PHYSICS LETTERS,
1981,
38
(12)
: 998
-
999
[2]
SURFACE PHOTOVOLTAGE MEASUREMENT OF LIGHT INSTABILITY OF AMORPHOUS-SILICON FILMS
EPSTEIN, KA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
EPSTEIN, KA
TRAN, NT
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
TRAN, NT
JEFFREY, FR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
JEFFREY, FR
MOORE, AR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
MOORE, AR
[J].
APPLIED PHYSICS LETTERS,
1986,
49
(03)
: 173
-
175
[3]
METHOD FOR MEASUREMENT OF SHORT MINORITY CARRIER DIFFUSION LENGTHS IN SEMICONDUCTORS
GOODMAN, AM
论文数:
0
引用数:
0
h-index:
0
GOODMAN, AM
[J].
JOURNAL OF APPLIED PHYSICS,
1961,
32
(12)
: 2550
-
&
[4]
HACK M, 1982, J APPL PHYS, V53, P5270
[5]
MCMAHON T, 1982, 16TH P IEEE PHOT SPE, P1389
[6]
THEORY AND EXPERIMENT ON THE SURFACE-PHOTOVOLTAGE DIFFUSION-LENGTH MEASUREMENT AS APPLIED TO AMORPHOUS-SILICON
MOORE, AR
论文数:
0
引用数:
0
h-index:
0
MOORE, AR
[J].
JOURNAL OF APPLIED PHYSICS,
1983,
54
(01)
: 222
-
228
[7]
COLLECTION LENGTH OF HOLES IN A-SI-H BY SURFACE PHOTO-VOLTAGE USING A LIQUID SCHOTTKY-BARRIER
MOORE, AR
论文数:
0
引用数:
0
h-index:
0
MOORE, AR
[J].
APPLIED PHYSICS LETTERS,
1982,
40
(05)
: 403
-
405
[8]
DIFFERENTIAL SURFACE PHOTOVOLTAGE MEASUREMENT OF MINORITY-CARRIER DIFFUSION LENGTH IN THIN-FILMS
SCHWARZ, R
论文数:
0
引用数:
0
h-index:
0
SCHWARZ, R
SLOBODIN, D
论文数:
0
引用数:
0
h-index:
0
SLOBODIN, D
WAGNER, S
论文数:
0
引用数:
0
h-index:
0
WAGNER, S
[J].
APPLIED PHYSICS LETTERS,
1985,
47
(07)
: 740
-
742
←
1
→
共 8 条
[1]
DIFFUSION LENGTH OF HOLES IN A-SI-H BY THE SURFACE PHOTO-VOLTAGE METHOD
DRESNER, J
论文数:
0
引用数:
0
h-index:
0
DRESNER, J
SZOSTAK, DJ
论文数:
0
引用数:
0
h-index:
0
SZOSTAK, DJ
GOLDSTEIN, B
论文数:
0
引用数:
0
h-index:
0
GOLDSTEIN, B
[J].
APPLIED PHYSICS LETTERS,
1981,
38
(12)
: 998
-
999
[2]
SURFACE PHOTOVOLTAGE MEASUREMENT OF LIGHT INSTABILITY OF AMORPHOUS-SILICON FILMS
EPSTEIN, KA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
EPSTEIN, KA
TRAN, NT
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
TRAN, NT
JEFFREY, FR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
JEFFREY, FR
MOORE, AR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716
MOORE, AR
[J].
APPLIED PHYSICS LETTERS,
1986,
49
(03)
: 173
-
175
[3]
METHOD FOR MEASUREMENT OF SHORT MINORITY CARRIER DIFFUSION LENGTHS IN SEMICONDUCTORS
GOODMAN, AM
论文数:
0
引用数:
0
h-index:
0
GOODMAN, AM
[J].
JOURNAL OF APPLIED PHYSICS,
1961,
32
(12)
: 2550
-
&
[4]
HACK M, 1982, J APPL PHYS, V53, P5270
[5]
MCMAHON T, 1982, 16TH P IEEE PHOT SPE, P1389
[6]
THEORY AND EXPERIMENT ON THE SURFACE-PHOTOVOLTAGE DIFFUSION-LENGTH MEASUREMENT AS APPLIED TO AMORPHOUS-SILICON
MOORE, AR
论文数:
0
引用数:
0
h-index:
0
MOORE, AR
[J].
JOURNAL OF APPLIED PHYSICS,
1983,
54
(01)
: 222
-
228
[7]
COLLECTION LENGTH OF HOLES IN A-SI-H BY SURFACE PHOTO-VOLTAGE USING A LIQUID SCHOTTKY-BARRIER
MOORE, AR
论文数:
0
引用数:
0
h-index:
0
MOORE, AR
[J].
APPLIED PHYSICS LETTERS,
1982,
40
(05)
: 403
-
405
[8]
DIFFERENTIAL SURFACE PHOTOVOLTAGE MEASUREMENT OF MINORITY-CARRIER DIFFUSION LENGTH IN THIN-FILMS
SCHWARZ, R
论文数:
0
引用数:
0
h-index:
0
SCHWARZ, R
SLOBODIN, D
论文数:
0
引用数:
0
h-index:
0
SLOBODIN, D
WAGNER, S
论文数:
0
引用数:
0
h-index:
0
WAGNER, S
[J].
APPLIED PHYSICS LETTERS,
1985,
47
(07)
: 740
-
742
←
1
→