PHYSICAL LIMITS IN SEMICONDUCTOR ELECTRONICS

[1] HOT-CARRIER INSTABILITY IN IGFETS [J]. APPLIED PHYSICS LETTERS, 1975, 27 (03) : 147 - 148

[2] BEALL RJ, 1974, 1974 INTERCON TECHN

[3] LOGICAL REVERSIBILITY OF COMPUTATION [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1973, 17 (06) : 525 - 532

[4] BREWER GR, 1971, IEEE SPECTRUM, V8, P23, DOI 10.1109/MSPEC.1971.5217844

[5] ELECTRON-BEAM FABRICATION OF 80-A METAL STRUCTURES [J]. APPLIED PHYSICS LETTERS, 1976, 29 (09) : 596 - 598

[6] BUIE JL, 1976, 1976 WESCON TECHN PA

[7] EXCESS CURRENT GENERATION DUE TO REVERSE BIAS P-N JUNCTION STRESS [J]. APPLIED PHYSICS LETTERS, 1968, 13 (08) : 264 - &

[8] VISIBILITY OF SINGLE ATOMS [J]. SCIENCE, 1970, 168 (3937) : 1338 - &

[9] EVERHART T, IN PRESS

[10] REPLICATION OF 0.1-MUM GEOMETRIES WITH X-RAY LITHOGRAPHY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1332 - 1335

[1] HOT-CARRIER INSTABILITY IN IGFETS [J]. APPLIED PHYSICS LETTERS, 1975, 27 (03) : 147 - 148

[2] BEALL RJ, 1974, 1974 INTERCON TECHN

[3] LOGICAL REVERSIBILITY OF COMPUTATION [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1973, 17 (06) : 525 - 532

[4] BREWER GR, 1971, IEEE SPECTRUM, V8, P23, DOI 10.1109/MSPEC.1971.5217844

[5] ELECTRON-BEAM FABRICATION OF 80-A METAL STRUCTURES [J]. APPLIED PHYSICS LETTERS, 1976, 29 (09) : 596 - 598

[6] BUIE JL, 1976, 1976 WESCON TECHN PA

[7] EXCESS CURRENT GENERATION DUE TO REVERSE BIAS P-N JUNCTION STRESS [J]. APPLIED PHYSICS LETTERS, 1968, 13 (08) : 264 - &

[8] VISIBILITY OF SINGLE ATOMS [J]. SCIENCE, 1970, 168 (3937) : 1338 - &

[9] EVERHART T, IN PRESS

[10] REPLICATION OF 0.1-MUM GEOMETRIES WITH X-RAY LITHOGRAPHY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1332 - 1335