CLEAN PROCESSING OF POLYMERS AND SMOOTHING OF CERAMICS BY PULSED-LASER MELTING

被引:21
作者
TOKAREV, VN
MARINE, W
PRAT, C
SENTIS, M
机构
[1] FAC SCI LUMINY, INTERDISCIPLINAIRE ABLAT LASER & APPLICAT LAB, CNRS, URA 783, F-13288 MARSEILLE 9, FRANCE
[2] FAC SCI LUMINY, INTERDISCIPLINAIRE ABLAT LASER & APPLICAT LAB, CNRS, URA 34, F-13288 MARSEILLE 9, FRANCE
关键词
D O I
10.1063/1.359440
中图分类号
O59 [应用物理学];
学科分类号
摘要
Surface stability during laser pulsed melting of polymers and ceramics is studied theoretically. Irradiation conditions and material parameters are found giving rise to the suppression of surface wavy relief of a nonresonant type (with period Λ≫λ, where λ is the radiation wavelength) and thus to the smooth flat irradiation spots. For example, for the polymers considered this process takes place for wavelengths where the absorption coefficient is sufficiently high: α(λ)≳105 cm -1. Thus, it is shown that the formation of such spots, previously referred to as "clean ablation," can be explained using only a thermal mechanism without reference to the concept of "photodecomposition." Moreover, laser smoothing and polishing of a surface, if it had roughness before irradiation, can be achieved by appropriate matching of the characteristic size of this roughness along the surface with the values of α(λ) and laser fluence. Methods are proposed to decrease the parasitic influence of droplets on the deposition of thin films by laser ablation of massive ceramic pellets. The results of theoretical modeling are shown to be in good agreement with experiments on smoothing of rough alumina ceramics and "clean" processing of polymers by excimer laser radiation. © 1995 American Institute of Physics.
引用
收藏
页码:4714 / 4723
页数:10
相关论文
共 52 条
[1]   THE ACTION OF POWERFUL LASER-RADIATION ON SURFACES OF SEMICONDUCTORS AND METALS - NONLINEAR OPTICAL EFFECTS AND NONLINEAR OPTICAL DIAGNOSTICS [J].
AKHMANOV, SA ;
EMELYANOV, VI ;
KOROTEYEV, NI ;
SEMINOGOV, VN .
USPEKHI FIZICHESKIKH NAUK, 1985, 147 (04) :675-745
[2]   DIRECT ETCHING OF POLYMERIC MATERIALS USING A XECL LASER [J].
ANDREW, JE ;
DYER, PE ;
FORSTER, D ;
KEY, PH .
APPLIED PHYSICS LETTERS, 1983, 43 (08) :717-719
[3]   MORPHOLOGICAL-CHANGES OF THE SURFACE-STRUCTURE OF POLYMERS DUE TO EXCIMER LASER-RADIATION - A SYNERGETIC EFFECT [J].
BAHNERS, T ;
SCHOLLMEYER, E .
JOURNAL OF APPLIED PHYSICS, 1989, 66 (04) :1884-1886
[4]   EXCIMER LASER ETCHING OF POLYIMIDE [J].
BRANNON, JH ;
LANKARD, JR ;
BAISE, AI ;
BURNS, F ;
KAUFMAN, J .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (05) :2036-2043
[5]  
BRAREN B, 1991, MAR INT C OPT SCI EN
[6]   TEMPERATURE-MEASUREMENTS OF POLYIMIDE DURING KRF EXCIMER LASER ABLATION [J].
BRUNCO, DP ;
THOMPSON, MO ;
OTIS, CE ;
GOODWIN, PM .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (09) :4344-4350
[7]  
BUGAEV AA, 1988, ZH TEKH FIZ+, V58, P908
[8]   ULTRAVIOLET-LASER-INDUCED PERIODIC SURFACE-STRUCTURES [J].
CLARK, SE ;
EMMONY, DC .
PHYSICAL REVIEW B, 1989, 40 (04) :2031-2041
[9]   DEPENDENCE OF PHOTOETCHING RATES OF POLYMERS AT 193 NM ON OPTICAL-ABSORPTION DEPTH [J].
COLE, HS ;
LIU, YS ;
PHILIPP, HR .
APPLIED PHYSICS LETTERS, 1986, 48 (01) :76-77
[10]   NOVEL METHOD FOR MEASURING EXCIMER LASER ABLATION THRESHOLDS OF POLYMERS [J].
DYER, PE ;
JENKINS, SD ;
SIDHU, J .
APPLIED PHYSICS LETTERS, 1988, 52 (22) :1880-1882