CAPABILITIES OF PROTON-INDUCED X-RAY-FLUORESCENCE IN ANALYTICAL-CHEMISTRY

被引：18

作者：

VIS, RD ^{[1
]}

VERHEUL, H ^{[1
]}

机构：

[1] VRIJE UNIV AMSTERDAM,NAT KUNDIG LAB,AMSTERDAM,NETHERLANDS

来源：

JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1975年 / 27卷 / 02期

关键词：

D O I：

10.1007/BF02520582

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：447 / 456

页数：10

共 14 条

[11] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL
JOHANSSON, TB
AKSELSSON, R
JOHANSSON, SA
[J]. NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01): : 141 - +
[12] TRACE-ELEMENT ANALYSIS USING PROTON-INDUCED X-RAY-EMISSION SPECTROSCOPY
VALKOVIC, V
LIEBERT, RB
ZABEL, T
LARSON, HT
MILJANIC, D
WHEELER, RM
PHILLIPS, GC
[J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 114 (03): : 573 - 579
[13] LIMITATIONS AND IMPROVEMENTS OF TRACE-ELEMENT ANALYSIS WITH PROTON-INDUCED X-RAYS
VERBA, JW
SUNIER, JW
WRIGHT, BT
SLAUS, I
HOLMAN, AB
KULLECK, JG
[J]. JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1972, 12 (01): : 171 - 179
[14] INVESTIGATION OF ANALYTICAL CAPABILITIES OF X-RAY EMISSION INDUCED BY HIGH ENERGY ALPHA PARTICLES
WATSON, RL
SJURSETH, JR
HOWARD, RW
[J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 93 (01): : 69 - &