A GAS-FLOW ELECTRON YIELD DETECTOR FOR GLANCING-INCIDENCE EXAFS

被引：10

作者：

JIANG, DT

CROZIER, ED

机构：

[1] Simon Fraser University, Burnaby

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1990年 / 294卷 / 03期

基金：

美国国家卫生研究院; 加拿大自然科学与工程研究理事会;

关键词：

D O I：

10.1016/0168-9002(90)90311-S

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A design of a total electron yield detector used in glancing-incidence EXAFS is described. This design allows the simultaneous detection of fluorescence and reflectivity. It also permits selecting different angles of the incident X-ray beam relative to a specific crystallographic direction to eliminate the Bragg diffractions in the energy range of interest. The EXAFS data obtained on a MBE-grown Ni film on a Fe(001) substrate are presented. © 1990.

引用

页码：666 / 668

页数：3

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