QUANTITATIVE-EVALUATION OF THE EBIC CONTRAST OF DISLOCATIONS

[1] ON THE EBIC CONTRAST OF DISLOCATIONS IN SI [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 69 (02): : 677 - 685

[2] SCANNING ELECTRON-MICROSCOPE EBIC AND CL MICROGRAPHS OF DISLOCATIONS IN GAP [J]. JOURNAL OF MATERIALS SCIENCE, 1977, 12 (09) : 1827 - 1833

[3] INFLUENCE OF THE GENERATION DISTRIBUTION ON THE CALCULATED EBIC CONTRAST OF LINE DEFECTS [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 73 (02): : 377 - 387

[4] DONOLATO C, 1978, OPTIK, V52, P19

[5] CONTRAST AND RESOLUTION OF SEM CHARGE-COLLECTION IMAGES OF DISLOCATIONS [J]. APPLIED PHYSICS LETTERS, 1979, 34 (01) : 80 - 81

[6] AN ANALYTICAL MODEL OF SEM AND STEM CHARGE COLLECTION IMAGES OF DISLOCATIONS IN THIN SEMICONDUCTOR LAYERS .1. MINORITY-CARRIER GENERATION, DIFFUSION, AND COLLECTION [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1981, 65 (02): : 649 - 658

[7] DONOLATO C, 1981, I PHYS C SER, V60, P215

[8] OBSERVATION OF DISLOCATIONS AND MICROPLASMA SITES IN SEMICONDUCTORS BY DIRECT CORRELATIONS OF STEBIC, STEM AND ELS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1980, 118 (MAR): : 263 - 273

[9] ELECTRON-BEAM-INDUCED CURRENTS IN SEMICONDUCTORS [J]. ANNUAL REVIEW OF MATERIALS SCIENCE, 1981, 11 : 353 - 380

[10] HOLT DB, 1974, QUANTITATIVE SCANNIN, P213

[1] ON THE EBIC CONTRAST OF DISLOCATIONS IN SI [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 69 (02): : 677 - 685

[2] SCANNING ELECTRON-MICROSCOPE EBIC AND CL MICROGRAPHS OF DISLOCATIONS IN GAP [J]. JOURNAL OF MATERIALS SCIENCE, 1977, 12 (09) : 1827 - 1833

[3] INFLUENCE OF THE GENERATION DISTRIBUTION ON THE CALCULATED EBIC CONTRAST OF LINE DEFECTS [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 73 (02): : 377 - 387

[4] DONOLATO C, 1978, OPTIK, V52, P19

[5] CONTRAST AND RESOLUTION OF SEM CHARGE-COLLECTION IMAGES OF DISLOCATIONS [J]. APPLIED PHYSICS LETTERS, 1979, 34 (01) : 80 - 81

[6] AN ANALYTICAL MODEL OF SEM AND STEM CHARGE COLLECTION IMAGES OF DISLOCATIONS IN THIN SEMICONDUCTOR LAYERS .1. MINORITY-CARRIER GENERATION, DIFFUSION, AND COLLECTION [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1981, 65 (02): : 649 - 658

[7] DONOLATO C, 1981, I PHYS C SER, V60, P215

[8] OBSERVATION OF DISLOCATIONS AND MICROPLASMA SITES IN SEMICONDUCTORS BY DIRECT CORRELATIONS OF STEBIC, STEM AND ELS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1980, 118 (MAR): : 263 - 273

[9] ELECTRON-BEAM-INDUCED CURRENTS IN SEMICONDUCTORS [J]. ANNUAL REVIEW OF MATERIALS SCIENCE, 1981, 11 : 353 - 380

[10] HOLT DB, 1974, QUANTITATIVE SCANNIN, P213