CURRENT DRIFT PHENOMENA AND SPECTROSCOPIC MEASUREMENT METHOD FOR INSULATOR TRAP LEVEL PARAMETERS IN INP MISFETS

被引：6

作者：

YAMAGUCHI, E

MINAKATA, M

FURUKAWA, Y

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1984年 / 23卷 / 01期

关键词：

D O I：

10.1143/JJAP.23.L49

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L49 / L51

页数：3

共 10 条

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