CONTROLLED DEGRADATION AND ABLATION OF POLYMER SURFACES BY ULTRAVIOLET-LASER RADIATION

被引:16
作者
SRINIVASAN, R
机构
[1] IBM, Yorktown Heights, NY, USA, IBM, Yorktown Heights, NY, USA
关键词
D O I
10.1016/0141-3910(87)90063-2
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
26
引用
收藏
页码:193 / 203
页数:11
相关论文
共 33 条
[1]   DIRECT ETCHING OF POLYMERIC MATERIALS USING A XECL LASER [J].
ANDREW, JE ;
DYER, PE ;
FORSTER, D ;
KEY, PH .
APPLIED PHYSICS LETTERS, 1983, 43 (08) :717-719
[2]  
BLUM SE, 1983, Patent No. 4414059
[3]   EXCIMER LASER ETCHING OF POLYIMIDE [J].
BRANNON, JH ;
LANKARD, JR ;
BAISE, AI ;
BURNS, F ;
KAUFMAN, J .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (05) :2036-2043
[4]  
BRAREN B, 1986, J POLYM SCI LETT, V24, P409
[5]   DEPENDENCE OF PHOTOETCHING RATES OF POLYMERS AT 193 NM ON OPTICAL-ABSORPTION DEPTH [J].
COLE, HS ;
LIU, YS ;
PHILIPP, HR .
APPLIED PHYSICS LETTERS, 1986, 48 (01) :76-77
[6]   VELOCITY DISTRIBUTION OF MOLECULAR FRAGMENTS FROM POLYMETHYLMETHACRYLATE IRRADIATED WITH UV LASER-PULSES [J].
DANIELZIK, B ;
FABRICIUS, N ;
ROWEKAMP, M ;
VONDERLINDE, D .
APPLIED PHYSICS LETTERS, 1986, 48 (03) :212-214
[7]   SPECTROSCOPIC STUDIES OF ARF LASER PHOTOABLATION OF PMMA [J].
DAVIS, GM ;
GOWER, MC ;
FOTAKIS, C ;
EFTHIMIOPOULOS, T ;
ARGYRAKIS, P .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 36 (01) :27-30
[8]   SELF-DEVELOPING UV PHOTORESIST USING EXCIMER LASER EXPOSURE [J].
DEUTSCH, TF ;
GEIS, MW .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (12) :7201-7204
[9]   EXCIMER LASER ABLATION AND THERMAL COUPLING EFFICIENCY TO POLYMER-FILMS [J].
DYER, PE ;
SIDHU, J .
JOURNAL OF APPLIED PHYSICS, 1985, 57 (04) :1420-1422
[10]   NANOSECOND PHOTOACOUSTIC STUDIES ON ULTRAVIOLET-LASER ABLATION OF ORGANIC POLYMERS [J].
DYER, PE ;
SRINIVASAN, R .
APPLIED PHYSICS LETTERS, 1986, 48 (06) :445-447