A FORWARD SCATTERING TECHNIQUE FOR THE DETERMINATION OF TARGET THICKNESS

被引:20
作者
PALLON, J
机构
关键词
D O I
10.1016/0168-583X(87)90300-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:87 / 90
页数:4
相关论文
共 5 条
[1]   USE OF RUTHERFORD SCATTERING ON A SECONDARY CARBON TARGET FOR CORRECTING INTERMEDIATE THICKNESS SAMPLE PIXE MEASUREMENTS [J].
ALOUPOGIANNIS, P ;
ROBAYE, G ;
ROELANDTS, I ;
WEBER, G ;
DELBROUCKHABARU, JM ;
QUISEFIT, JP .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 14 (03) :297-303
[2]   PRECISION OF PIXE ANALYSIS OF THIN FLUID-RESIDUE SPECIMENS USING INTERNAL STANDARDS [J].
CAMPBELL, JL ;
TEESDALE, WJ ;
LEIGH, RG .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 6 (03) :551-557
[3]  
Chu W. K., 1978, BACKSCATTERING SPECT
[4]   NONDESTRUCTIVE MEASUREMENT OF HYDROGEN IN THIN SHEET MATERIALS [J].
JARVIS, ON ;
SHERWOOD, AC .
NUCLEAR INSTRUMENTS & METHODS, 1974, 115 (01) :271-275
[5]   HYDROGEN PROFILING BY PROTON PROTON-SCATTERING [J].
WILLEMSEN, MFC ;
THEUNISSEN, AML ;
KUIPER, AET .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 15 (1-6) :492-494