SURFACE SPECTROSCOPY USING HIGH-ENERGY HEAVY-IONS

被引：11

作者：

DOYLE, BL ^{[1
]}

PEERCY, PS ^{[1
]}

GRAY, TJ ^{[1
]}

COCKE, CL ^{[1
]}

JUSTINIANO, E ^{[1
]}

机构：

[1] KANSAS STATE UNIV AGR & APPL SCI,DEPT PHYS,MANHATTAN,KS 66506

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1983年 / 30卷 / 02期

关键词：

D O I：

10.1109/TNS.1983.4332502

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1252 / 1254

页数：3

共 11 条

[1] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES [J].

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[2] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J].

BENNINGHOVEN, A .

SURFACE SCIENCE, 1973, 35 (01) :427-457

[3]

BOSCH F, 1978, SCIENCE FEB, V199

[4] FAST HEAVY-ION INDUCED DESORPTION OF BIOMOLECULES [J].

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KAMENSKY, I ;

SUNDQVIST, B ;

FOHLMAN, J ;

PETERSON, P .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (02) :1776-1778

[5] TECHNIQUE FOR MEASURING HYDROGEN CONCENTRATION VERSUS DEPTH IN SOLID SAMPLES [J].

LEICH, DA ;

TOMBRELLO, TA .

NUCLEAR INSTRUMENTS & METHODS, 1973, 108 (01) :67-71

[6] SECONDARY ION QUADRUPOLE MASS-SPECTROMETER FOR DEPTH PROFILING-DESIGN AND PERFORMANCE EVALUATION [J].

MAGEE, CW ;

HARRINGTON, WL ;

HONIG, RE .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (04) :477-485

[7] THEORETICAL AND EXPERIMENTAL STUDY OF IONIZATION PROCESSES DURING LOW-ENERGY ION SPUTTERING [J].

SROUBEK, Z .

SURFACE SCIENCE, 1974, 44 (01) :47-59

[8] VELOCITY FILTERING FOR SECONDARY ION QUADRUPOLE MASS-SPECTROMETER [J].

SROUBEK, Z .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (09) :1403-1404

[9] NEW APPROACH TO MASS-SPECTROSCOPY OF NONVOLATILE COMPOUNDS [J].

TORGERSON, DF ;

SKOWRONSKI, RP ;

MACFARLANE, RD .

BIOCHEMICAL AND BIOPHYSICAL RESEARCH COMMUNICATIONS, 1974, 60 (02) :616-621

[10]

Wittmaack K., 1973, International Journal of Mass Spectrometry and Ion Physics, V11, P23, DOI 10.1016/0020-7381(73)80052-X

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