HIGH-TEMPERATURE SCANNING TUNNELING MICROSCOPE

被引：12

作者：

WATANABE, MO

TANAKA, K

SAKAI, A

机构：

[1] Toshiba R&D Centel, Saiwai-ku, Kawasaki, 21C, 1, Komukai Toshiba-cha

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期

关键词：

D O I：

10.1116/1.577099

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A novel scanning tunneling microscope that operates at high temperature has been developed. We originally designed a new type of microscope that heats only the sample and maintains the other elements at room temperature. The design uses bimorph piezoelectric drivers that are placed apart from the sample by five orthogonal arms. The sensitivity of the piezoelectric drivers is independent of the sample temperature. Atomic scale images of graphite at temperatures ranging from room temperature to 400 °C are obtained. © 1990, American Vacuum Society. All rights reserved.

引用

页码：327 / 329

页数：3

共 6 条

[1] SCANNING TUNNELING MICROSCOPY [J].