MOLECULAR-DYNAMICS SIMULATION OF ATOMIC LAYER ETCHING OF SILICON

被引:100
作者
ATHAVALE, SD [1 ]
ECONOMOU, DJ [1 ]
机构
[1] UNIV HOUSTON,DEPT CHEM ENGN,PLASMA PROC LAB,HOUSTON,TX 77204
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1995年 / 13卷 / 03期
关键词
D O I
10.1116/1.579659
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:966 / 971
页数:6
相关论文
共 44 条
[1]  
[Anonymous], 1992, MOL DYNAMICS SIMULAT
[2]   MOLECULAR LAYER ETCHING OF GAAS [J].
AOYAGI, Y ;
SHINMURA, K ;
KAWASAKI, K ;
TANAKA, T ;
GAMO, K ;
NAMBA, S ;
NAKAMOTO, I .
APPLIED PHYSICS LETTERS, 1992, 60 (08) :968-970
[3]   ATOMIC LAYER MANIPULATION OF III-V COMPOUNDS [J].
AOYAGI, Y ;
SHINMURA, K ;
KAWASAKI, K ;
NAKAMOTO, I ;
GAMO, K ;
NAMBA, S .
THIN SOLID FILMS, 1993, 225 (1-2) :120-123
[4]   CHEMICAL AND PHYSICAL SPUTTERING OF FLUORINATED SILICON [J].
BARONE, ME ;
GRAVES, DB .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (03) :1263-1274
[5]   MOLECULAR-DYNAMICS WITH COUPLING TO AN EXTERNAL BATH [J].
BERENDSEN, HJC ;
POSTMA, JPM ;
VANGUNSTEREN, WF ;
DINOLA, A ;
HAAK, JR .
JOURNAL OF CHEMICAL PHYSICS, 1984, 81 (08) :3684-3690
[6]   DIGITAL ETCHING OF III-V MULTILAYERED STRUCTURES COMBINED WITH LASER IONIZATION MASS-SPECTROSCOPY - PHOTON-ASSISTED DEPTH PROFILING [J].
BOURNE, OL ;
HART, D ;
RAYNER, DM ;
HACKETT, PA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (03) :556-561
[7]   ION-ASSISTED ETCHING OF SI WITH CL2 - THE EFFECT OF FLUX RATIO [J].
COBURN, JW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03) :1384-1389
[8]  
Davies L, 1993, EFFICIENCY RES DEV P
[9]   STUDIES ON THE MECHANISM OF CHEMICAL SPUTTERING OF SILICON BY SIMULTANEOUS EXPOSURE TO CL-2 AND LOW-ENERGY AR+ IONS [J].
DIELEMAN, J ;
SANDERS, FHM ;
KOLFSCHOTEN, AW ;
ZALM, PC ;
DEVRIES, AE ;
HARING, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (05) :1384-1392
[10]   CHEMICAL SPUTTERING OF SI RELATED TO ROUGHNESS FORMATION OF A CL-PASSIVATED SI SURFACE [J].
FEIL, H ;
DIELEMAN, J ;
GARRISON, BJ .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (02) :1303-1309