PHOTOPOLARIMETER BASED ON PLANAR GRATING DIFFRACTION

被引:31
作者
AZZAM, RMA
GIARDINA, KA
机构
[1] Department of Electrical Engineering, University of New Orleans, Lakefront, New Orleans, LA
来源
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1993年 / 10卷 / 06期
关键词
D O I
10.1364/JOSAA.10.001190
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A division-of-amplitude photopolarimeter (DOAP) is described that employs a diffraction grating in the conventional spectrometer orientation with the grating grooves normal to the plane of incidence. Four coplanar diffracted orders are used for polarimetric analysis to determine all four Stokes parameters of incident light simultaneously and virtually instantaneously (with the speed being determined solely by the photodetectors and their associated electronics); a fifth order is used for alignment by autocollimation or by use of a position-sensing quadrant detector. To sensitize the instrument for the +45-degrees and -45-degrees azimuths of incident linearly polarized light and for the handedness of incident circular polarization (i.e., for the third and fourth Stokes parameters), we insert two linear polarizers in two diffracted orders with their transmission axes inclined at appropriate angles with respect to the plane of incidence. The calibration and testing of an instrument of this type that uses an Al-coated 600-groove/mm holographic grating at 632.8-nm wavelength are reported as an example.
引用
收藏
页码:1190 / 1196
页数:7
相关论文
共 38 条
[21]  
Cross R., 1991, Lasers & Optronics, V10, P25
[22]   OPTICAL-ELEMENTS WITH ULTRAHIGH SPATIAL-FREQUENCY SURFACE CORRUGATIONS [J].
ENGER, RC ;
CASE, SK .
APPLIED OPTICS, 1983, 22 (20) :3220-3228
[23]   SUBMICROMETER PERIODICITY GRATINGS AS ARTIFICIAL ANISOTROPIC DIELECTRICS [J].
FLANDERS, DC .
APPLIED PHYSICS LETTERS, 1983, 42 (06) :492-494
[24]   ANALYSIS AND APPLICATIONS OF OPTICAL DIFFRACTION BY GRATINGS [J].
GAYLORD, TK ;
MOHARAM, MG .
PROCEEDINGS OF THE IEEE, 1985, 73 (05) :894-937
[25]  
HAGYARD MJ, 1985, NASA CP2374
[26]   RECENT DEVELOPMENTS IN INSTRUMENTATION IN ELLIPSOMETRY [J].
HAUGE, PS .
SURFACE SCIENCE, 1980, 96 (1-3) :108-140
[27]   4-CHANNEL POLARIMETER FOR TIME-RESOLVED ELLIPSOMETRY [J].
JELLISON, GE .
OPTICS LETTERS, 1987, 12 (10) :766-768
[28]   CALIBRATION, PROPERTIES, AND APPLICATIONS OF THE DIVISION-OF-AMPLITUDE PHOTOPOLARIMETER AT 632.8 AND 1523-NM [J].
KRISHNAN, S .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1992, 9 (09) :1615-1622
[29]  
MEYER CF, 1949, DIFFRACTION LIGHT X, P136
[30]   3-DIMENSIONAL VECTOR COUPLED-WAVE ANALYSIS OF PLANAR-GRATING DIFFRACTION [J].
MOHARAM, MG ;
GAYLORD, TK .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1983, 73 (09) :1105-1112