RECENT DEVELOPMENTS IN INSTRUMENTATION IN ELLIPSOMETRY

[1] Abramowitz M., 1965, HDB MATH FUNCTIONS

[2] A POLARIMETER IN THE MICROWAVE REGION [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1958, 46 (01): : 194 - 198

[3] ALLEN S, 1975, OPTICAL PROPERTIES H, P503

[4] PHOTOELECTRIC ANALYSIS OF ELLIPTICALLY POLARIZED LIGHT [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1952, 65 (394): : 758 - 768

[5] Aspnes D. E., 1973, Optics Communications, V8, P222, DOI 10.1016/0030-4018(73)90132-6

[6] Aspnes D.E., 1976, OPTICAL PROPERTIES S

[7] PRECISION BOUNDS TO ELLIPSOMETER SYSTEMS [J]. APPLIED OPTICS, 1975, 14 (05): : 1131 - 1136

[8] HIGH PRECISION SCANNING ELLIPSOMETER [J]. APPLIED OPTICS, 1975, 14 (01): : 220 - 228

[9] PHOTOMETRIC ELLIPSOMETER FOR MEASURING FLUX IN A GENERAL STATE OF POLARIZATION [J]. SURFACE SCIENCE, 1976, 56 (01) : 161 - 169

[10] PHOTOMETRIC ELLIPSOMETER FOR MEASURING PARTIALLY POLARIZED-LIGHT [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1975, 65 (11) : 1274 - 1278

[1] Abramowitz M., 1965, HDB MATH FUNCTIONS

[2] A POLARIMETER IN THE MICROWAVE REGION [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1958, 46 (01): : 194 - 198

[3] ALLEN S, 1975, OPTICAL PROPERTIES H, P503

[4] PHOTOELECTRIC ANALYSIS OF ELLIPTICALLY POLARIZED LIGHT [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1952, 65 (394): : 758 - 768

[5] Aspnes D. E., 1973, Optics Communications, V8, P222, DOI 10.1016/0030-4018(73)90132-6

[6] Aspnes D.E., 1976, OPTICAL PROPERTIES S

[7] PRECISION BOUNDS TO ELLIPSOMETER SYSTEMS [J]. APPLIED OPTICS, 1975, 14 (05): : 1131 - 1136

[8] HIGH PRECISION SCANNING ELLIPSOMETER [J]. APPLIED OPTICS, 1975, 14 (01): : 220 - 228

[9] PHOTOMETRIC ELLIPSOMETER FOR MEASURING FLUX IN A GENERAL STATE OF POLARIZATION [J]. SURFACE SCIENCE, 1976, 56 (01) : 161 - 169

[10] PHOTOMETRIC ELLIPSOMETER FOR MEASURING PARTIALLY POLARIZED-LIGHT [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1975, 65 (11) : 1274 - 1278