RECENT DEVELOPMENTS IN INSTRUMENTATION IN ELLIPSOMETRY

被引：177

作者：

HAUGE, PS

机构：

来源：

关键词：

D O I：

10.1016/0039-6028(80)90297-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：108 / 140

页数：33

共 120 条

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HAUGE, PS
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[72] MICROWAVE MAGNETO-KERR EFFECT IN SILICON AND GERMANIUM .I. MEASUREMENT OF COMPLEX HALL FACTOR
HAUGE, PS
CHAMPLIN, KS
[J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) : 2395 - &
[73] DUAL-MODE REFLECTOMETER FOR MEASURING MICROWAVE MAGNETIC KERR EFFECT IN SEMICONDUCTORS
HAUGE, PS
CHAMPLIN, KS
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1967, MT15 (07) : 406 - &
[74] HAUGE PS, UNPUBLISHED
[75] HAUGE PS, 1977, P SOC PHOTO-OPT INST, V112, P2
[76] HAUGE PS, 1979, J OPT SOC AM, V69, P1519
[77] INTERFEROMETRIC ELLIPSOMETRY
HAZEBROEK, HF
HOLSCHER, AA
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (09): : 822 - 826
[78] THEORY DESIGN AND CALIBRATION OF A UV SPECTROPHOTOPOLARIMETER
HODGDON, EB
[J]. APPLIED OPTICS, 1965, 4 (11): : 1479 - &
[79] SEARCH FOR FARADAY-ROTATION IN X-RAY REGION
HRDY, J
KROUSKY, E
RENNER, O
[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1979, 53 (01): : 143 - 146
[80] ROTATING DEPOLARIZER ELLIPSOMETRY
HUNDERI, O
[J]. APPLIED OPTICS, 1977, 16 (11): : 3012 - 3015