THIN-FILM GROWTH OF PB(ZR, TI)O3 BY PHOTOENHANCED METALORGANIC CHEMICAL-VAPOR-DEPOSITION USING NO2

被引:21
作者
SHIMIZU, M
KATAYAMA, T
SUGIYAMA, M
SHIOSAKI, T
机构
[1] Department of Electronics, Kyoto University, Sakyo-ku, Kyoto, 606, Yoshida Honmachi
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷 / 9B期
关键词
PHOTO-MOCVD; FERROELECTRIC PB(ZR; TI)O3; FILM; PHOTOIRRADIATION EFFECT; CRYSTALLINE STRUCTURE; GROWTH RATE; DIELECTRIC PROPERTIES; FERROELECTRIC PROPERTIES; LEAKAGE CURRENT DENSITY; STEP COVERAGE;
D O I
10.1143/JJAP.32.4074
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ferroelectric Pb(Zr, Ti)03 thin films were successfully grown by photoenhanced metalorganic chemical vapor deposition (photo-MOCVD), using Pb(C2H5)4, Zr(O-t-C4H9)4, Ti(O-i-C3H7)4 and NO2. Both tetragonal and rhombohedral Pb(Zr, Ti)O3 thin films were obtained at substrate temperatures higher than 535-degrees-C. Significant effects of photoirradiation on the growth behavior were observed. The observed effects included an increase in the growth rate and film compositional ratio of Zr/(Zr+Ti), and a change in the electrical properties. A decrease in the growth temperature of the Pb(Zr, Ti)O3 films caused by photoirradiation was observed only when the films were grown at low gas supply ratios of [Zr]/([Zr]+[Ti]). The photodeposited Pb(Zr, Ti)O3 films obtained showed good ferroelectric properties, good leakage characteristic and good step coverage.
引用
收藏
页码:4074 / 4077
页数:4
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