IRON DIFFUSIVITY IN SILICON - IMPACT OF CHARGE-STATE

被引:20
作者
KOVESHNIKOV, SV
ROZGONYI, GA
机构
[1] N CAROLINA STATE UNIV,DEPT MAT SCI & ENGN,RALEIGH,NC 27695
[2] CHERNOGOLOVKA MICOELECTR TECHNOL INST,CHERNOGOLOVKA 142432,RUSSIA
关键词
D O I
10.1063/1.113411
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of iron charge state on its diffusion in p-type Si near room temperature has been investigated by C-V and depth dependent deep-level transient spectroscopy measurements. The migration enthalpies of both positively charged and neutral iron were found to be 0.92 and 0.56 eV, respectively. Disagreement between the theoretical predictions and experimentally observed trend in iron diffusion is briefly discussed in terms of diffusion path, elastic strain, and Coulombic interaction versus impurity charge state. © 1995 American Institute of Physics.
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页码:860 / 862
页数:3
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