SPECTRAL LINEWIDTH OF A FREE-RUNNING CONTINUOUS-WAVE SINGLE-FREQUENCY EXTERNAL-CAVITY QUANTUM-WELL INGAAS/ALGAAS DIODE-LASER

被引:4
作者
HSU, L
MOORADIAN, A
AGGARWAL, RL
机构
[1] Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA
关键词
D O I
10.1364/OL.20.001788
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The linewidth of a room-temperature free-running 940-nm cw single-frequency 1-mm-long quantum-well InGaAs/AlGaAs diode laser in a 10-cm-long external cavity has been measured as a function of the output power by the heterodyne technique. The power-dependent component of the observed Lorentzian linewidth displays a linewidth-power product of 28 +/- 4 kHz mW, which is 2 orders of magnitude larger than that predicted from the spontaneous emission model. The shot-noise model of Welford and Mooradian [Appl. Phys. Lett. 40, 560 (1982)] for the power-independent linewidth has been extended to account for the observed power-dependent linewidth.
引用
收藏
页码:1788 / 1790
页数:3
相关论文
共 12 条
[1]   SPECTRAL CHARACTERISTICS OF EXTERNAL-CAVITY CONTROLLED SEMICONDUCTOR-LASERS [J].
FLEMING, MW ;
MOORADIAN, A .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1981, 17 (01) :44-59
[2]  
HARRISON J, 1987, THESIS MIT CAMBRIDGE
[3]   THEORY OF THE LINEWIDTH OF SEMICONDUCTOR-LASERS [J].
HENRY, CH .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1982, 18 (02) :259-264
[4]  
HSU L, 1994, THESIS MIT CAMBRIDGE
[5]   ESTIMATION OF THE ULTIMATE FREQUENCY STABILITY OF SEMICONDUCTOR-LASERS [J].
OHTSU, M ;
FUKADA, H ;
TAKO, T ;
TSUCHIDA, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (07) :1157-1166
[6]   MODE-INSTABILITY AND LINEWIDTH REBROADENING IN DFB LASERS [J].
OLESEN, H ;
TROMBORG, B ;
LASSEN, HE ;
PAN, X .
ELECTRONICS LETTERS, 1992, 28 (05) :444-446
[7]   PERFORMANCE-CHARACTERISTICS OF 1.5-MU-M EXTERNAL CAVITY SEMICONDUCTOR-LASERS FOR COHERENT OPTICAL COMMUNICATION [J].
OLSSON, NA ;
VANDERZIEL, JP .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1987, 5 (04) :510-515
[8]   INFRARED AND OPTICAL MASERS [J].
SCHAWLOW, AL ;
TOWNES, CH .
PHYSICAL REVIEW, 1958, 112 (06) :1940-1949
[9]   LINE BROADENING AND INTENSITY NOISE DUE TO POLARIZATION SWITCHING IN EXTERNAL CAVITY DIODE-LASERS [J].
SYVRIDIS, D ;
GUEKOS, G .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1993, 5 (02) :151-154
[10]   OCCUPATION FLUCTUATION NOISE - A FUNDAMENTAL SOURCE OF LINEWIDTH BROADENING IN SEMICONDUCTOR-LASERS [J].
VAHALA, K ;
YARIV, A .
APPLIED PHYSICS LETTERS, 1983, 43 (02) :140-142