ACCURATE DETERMINATION OF HETEROJUNCTION BAND DISCONTINUITIES IN THE PRESENCE OF INTERFACE TRAPS USING CAPACITANCE-VOLTAGE TECHNIQUES

被引：2

作者：

LEU, LY ^{[1
]}

FORREST, SR ^{[1
]}

机构：

[1] UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90089

来源：

JOURNAL OF APPLIED PHYSICS | 1989年 / 65卷 / 12期

关键词：

D O I：

10.1063/1.343214

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4818 / 4822

页数：5

共 19 条

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