A LOW-TEMPERATURE TOTAL ELECTRON YIELD DETECTOR FOR X-RAY-ABSORPTION FINE-STRUCTURE SPECTRA

被引：33

作者：

KEMNER, KM ^{[1
]}

KROPF, J ^{[1
]}

BUNKER, BA ^{[1
]}

机构：

[1] UNIV NOTRE DAME,DEPT PHYS,NOTRE DAME,IN 46556

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1994年 / 65卷 / 12期

关键词：

D O I：

10.1063/1.1144489

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A design of a total electron yield detector to collect x-ray absorption fine structure spectra between 80 K and room temperature is described. In addition, a three-stage goniometer setup has been incorporated into the detector to facilitate manipulation of the sample. The results of simple linearity checks to investigate the detector's electrical performance are presented. Finally, the detector's thermal stability is discussed. © 1994 American Institute of Physics.

引用

页码：3667 / 3669

页数：3

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