MICROSCOPIC MECHANISM OF HYDROGEN PASSIVATION OF ACCEPTOR SHALLOW LEVELS IN SILICON

被引:85
作者
ASSALI, LVC
LEITE, JR
机构
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D O I
10.1103/PhysRevLett.55.980
中图分类号
O4 [物理学];
学科分类号
0702 ;
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页码:980 / 982
页数:3
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  • [21] DEACTIVATION OF THE BORON ACCEPTOR IN SILICON BY HYDROGEN
    SAH, CT
    SUN, JY
    TZOU, JJ
    [J]. APPLIED PHYSICS LETTERS, 1983, 43 (02) : 204 - 206
  • [22] SELF-CONSISTENT-FIELD INVESTIGATION OF LOCATION AND HYPERFINE INTERACTION OF MUONIUM IN DIAMOND
    SAHOO, N
    MISHRA, SK
    MISHRA, KC
    COKER, A
    DAS, TP
    MITRA, CK
    SNYDER, LC
    GLODEANU, A
    [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (12) : 913 - 917
  • [23] PASSIVATION OF GRAIN-BOUNDARIES IN SILICON
    SEAGER, CH
    SHARP, DJ
    PANITZ, JKG
    DAIELLO, RV
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03): : 430 - 435
  • [24] DEEP LEVEL, QUENCHED-IN DEFECTS IN SILICON DOPED WITH GOLD, SILVER, IRON, COPPER OR NICKEL
    TAVENDALE, AJ
    PEARTON, SJ
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1983, 16 (09): : 1665 - 1673
  • [25] JAHN-TELLER DISTORTION AND ELECTRONIC-STRUCTURE OF O-CENTER IN CAF2 - MS X ALPHA STUDY
    WEBER, J
    BILL, H
    [J]. CHEMICAL PHYSICS LETTERS, 1977, 52 (03) : 562 - 566
  • [26] HYPERFINE INTERACTION BETWEEN HYDROGENS AND DANGLING BONDS IN A-SI-H STUDIED BY ENDOR
    YAMASAKI, S
    KURODA, S
    TANAKA, K
    HAYASHI, S
    [J]. SOLID STATE COMMUNICATIONS, 1984, 50 (01) : 9 - 11
  • [27] [No title captured]