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THE ROOM-TEMPERATURE OXIDATION OF CU/SI(100) AND CU/SI(111) INTERFACES STUDIED BY AUGER-ELECTRON SPECTROSCOPY, ELECTRON ENERGY-LOSS SPECTROSCOPY, AND HIGH-RESOLUTION ELECTRON ENERGY-LOSS SPECTROSCOPY

被引：24
作者：
MOLLER, PJ
HE, JW
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期
关键词：
D O I：
10.1116/1.574309
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：996 / 1002
页数：7
相关论文
共 23 条
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  • [2] IDENTIFICATION OF CU(I) AND CU(II) OXIDES BY ELECTRON SPECTROSCOPIC METHODS - AES, ELS AND UPS INVESTIGATIONS
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    [J]. PHYSICAL REVIEW B, 1985, 31 (10): : 6402 - 6410
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    [J]. PHYSICAL REVIEW B, 1982, 26 (10): : 5716 - 5729
  • [6] CU-SI(111) INTERFACES - OXIDATION PROPERTIES IN RELATION WITH THEIR STRUCTURAL-PROPERTIES
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    [J]. SURFACE SCIENCE, 1985, 152 (APR) : 1239 - 1246
  • [7] 7X7 SI(111)-CU INTERFACES - COMBINED LEED, AES AND EELS MEASUREMENTS
    DAUGY, E
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    LAYET, JM
    [J]. SURFACE SCIENCE, 1985, 154 (01) : 267 - 283
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    HANBUCKEN, M
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    [J]. SURFACE SCIENCE, 1986, 168 (1-3) : 122 - 132
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    [J]. SURFACE SCIENCE, 1985, 162 (1-3) : 622 - 627
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    Hiraki, Akio
    [J]. SURFACE SCIENCE REPORTS, 1983, 3 (07) : 357 - 412
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