APPLICATIONS OF ELECTRICAL NOISE

被引:24
作者
GUPTA, MS
机构
[1] MIT,RES LAB ELECTR,CAMBRIDGE,MA 02139
[2] MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
关键词
D O I
10.1109/PROC.1975.9877
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:996 / 1010
页数:15
相关论文
共 126 条
[71]   MEASUREMENTS OF MULTIPLICATION EFFECTS ON NOISE IN SILICON AVALANCHE DIODES [J].
NAQVI, IM ;
LEE, CA ;
DALMAN, GC .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1968, 56 (11) :2051-&
[72]   SPECTRUM OF FLUCTUATIONS AND LIFEPATH IN SILICON [J].
OKAZAKI, S ;
HIRAMATSU, M .
SOLID-STATE ELECTRONICS, 1965, 8 (04) :401-+
[73]   CONFIRMATION OF LIFETIMES BY NOISE AND BY HAYNES-SHOCKLEY METHOD [J].
OKAZAKI, S .
JOURNAL OF APPLIED PHYSICS, 1961, 32 (04) :712-&
[74]   MEASUREMENT OF LIFETIME IN GE FROM NOISE [J].
OKAZAKI, S ;
OKI, H .
PHYSICAL REVIEW, 1960, 118 (04) :1023-1024
[75]  
OLIVER W, 1965, ELECTRON ENG, V37, P714
[76]   NEW PARADOX IN CIRCUIT THEORY [J].
PENFIELD, P .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1968, 56 (07) :1225-&
[77]   THERMODYNAMICS AND MANLEY-ROWE EQUATIONS [J].
PENFIELD, P .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (13) :4629-&
[78]   UNRESOLVED PARADOX IN CIRCUIT THEORY [J].
PENFIELD, P .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (09) :1200-&
[79]  
PENFIELD P, 1968, P IEEE, V56, P2073
[80]  
PENFIELD P, 1969, P IEEE, V57, P711