COMBINED STUDY OF RHEED SPOT PROFILES AND INTENSITY OSCILLATIONS DURING MBE GROWTH OF GE ON GE(111)

被引：1

作者：

DAWERITZ, L ^{[1
]}

PCHELYAKOV, OP ^{[1
]}

MASHANOV, VI ^{[1
]}

SOKOLOV, LV ^{[1
]}

STENIN, SI ^{[1
]}

BERGER, H ^{[1
]}

机构：

[1] ACAD SCI USSR,INST SEMICOND PHYS,NOVOSIBIRSK 90,USSR

来源：

SURFACE SCIENCE | 1990年 / 230卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(90)90007-U

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The problem to define particular points in the growth sequence and to obtain quantitative data on the step-terrace structure of the growing surface is addressed in an analysis of RHEED spot profiles and intensity oscillations recorded simultaneously during MBE growth of Ge on Ge(111). © 1990.

引用

页码：L162 / L168

页数：7

共 20 条

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