共 27 条
[1]
BARBER N, 1987, J APPL PHYS, V62, P2853
[2]
CASTALDINI A, 1989, I PHYS C SER, V104, P169
[3]
DROZDOV NA, 1976, JETP LETT+, V23, P597
[4]
FAIR RB, 1981, J ELECTROCHEM SOC, V28, P1360
[6]
HAWKINS I, 1990, THESIS UMIST
[7]
Hu S. M., 1981, Defects in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P333
[8]
TIME AND TEMPERATURE-DEPENDENCE OF DENSITY OF OXIDATION-INDUCED STACKING-FAULTS IN DIAMOND-LAPPED SILICON
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS,
1984, 23 (08)
:L620-L622
[9]
KANIEWSKI J, 1991, 16TH P INT C DEF SEM