OPTICAL-PROPERTIES OF WIDE-GAP II-VI ZNTE EPILAYERS

被引:3
作者
AVEROUS, M
ABOUNADI, A
AULOMBARD, RL
BOUCHARA, D
BRIOT, N
BRIOT, O
CALAS, J
CLOITRE, T
GIL, B
机构
[1] Groupe d'Etudes des Semiconducteurs, Université de Montpellier II
来源
PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1994年 / 181卷 / 02期
关键词
D O I
10.1002/pssb.2221810218
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The optical properties of ZnTe epilayers grown by low-pressure metal organic vapour phase epitaxy on GaAs and GaSb substrates are studied. The layers are grown by using the halide-free triethylamine dimethylzinc adduct and di-isopropyl telluride as zinc and tellurium precursors, respectively. A detailed analysis of the residual strain is offered as a function of layer thickness and substrate nature via reflectivity measurements performed at pumped liquid helium temperature. This is completed by an extensive analysis of near-band-edge photoluminescence spectra in order to discriminate the contribution of residual impurities. Using these precursors ZnTe layers with extremely low contamination rates are obtained.
引用
收藏
页码:427 / 437
页数:11
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