NONCONTACT ELECTRICAL CHARACTERIZATION OF EPITAXIAL HGCDTE

被引：8

作者：

JONES, CE

BOYD, ME

KONKEL, WH

PERKOWITZ, S

BRAUNSTEIN, R

机构：

[1] EMORY UNIV,DEPT PHYS,ATLANTA,GA 30322

[2] UNIV CALIF LOS ANGELES,DEPT PHYS,LOS ANGELES,CA 90024

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1986年 / 4卷 / 04期

关键词：

D O I：

10.1116/1.574026

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：2056 / 2060

页数：5

共 13 条

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[9] CHARACTERIZATION OF GAAS BY FAR INFRARED REFLECTIVITY [J].

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