FORMATION OF POLYSILICON FILMS BY CATALYTIC CHEMICAL VAPOR-DEPOSITION (CAT-CVD) METHOD

被引:97
作者
MATSUMURA, H
机构
[1] Department of Physical Electronics, Hiroshima University, Kagamiyama, Higashi-Hiroshima
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1991年 / 30卷 / 8B期
关键词
POLYSILICON; CATALYTIC-CVD (CAT-CVD); CVD; THIN-FILM DEPOSITION; THIN FILMS; LOW-TEMPERATURE DEPOSITION;
D O I
10.1143/JJAP.30.L1522
中图分类号
O59 [应用物理学];
学科分类号
摘要
Silicon films are deposited by a new plasma-free and low-temperature deposition technique, the catalytic chemical vapor deposition (cat-CVD) method, in which deposition gases are decomposed by reactions with a heated catalyzer placed near substrates. It is found that polysilicon films of a grain size of around 0.1-mu-m can be easily obtained at substrate temperatures lower than 450-degrees-C by this cat-CVD method when gas pressure P(g) is below a certain critical value, although films are amorphous even for substrate temperatures higher than 450-degrees-C when P(g) is larger than such a critical gas pressure.
引用
收藏
页码:L1522 / L1524
页数:3
相关论文
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