ELECTRONIC CHARACTERIZATION OF COMPOUND SEMICONDUCTOR SURFACES AND INTERFACES

被引：24

作者：

MONCH, W

机构：

来源：

关键词：

D O I：

10.1016/0040-6090(83)90569-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：285 / 299

页数：15

共 78 条

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