A SURVEY OF THE GEOMETRICAL RECONSTRUCTION OF [011] DEFECTS IN SEMICONDUCTORS - GRAIN-BOUNDARIES AND DISLOCATIONS

被引：53

作者：

PAPON, AM

PETIT, M

机构：

来源：

SCRIPTA METALLURGICA | 1985年 / 19卷 / 04期

关键词：

D O I：

10.1016/0036-9748(85)90100-0

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：391 / 396

页数：6

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