EVIDENCE FOR THE DEFECT POOL CONCEPT FOR SI DANGLING BOND STATES IN A-SI-H FROM EXPERIMENTS WITH THIN-FILM TRANSISTORS

被引:24
作者
POWELL, MJ
FRENCH, ID
HUGHES, JR
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关键词
D O I
10.1016/0022-3093(89)90676-5
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:642 / 644
页数:3
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