A GENERAL CONTROL-VOLUME FORMULATION FOR MODELING IMPACT IONIZATION IN SEMICONDUCTOR TRANSPORT

被引:18
作者
LAUX, SE [1 ]
GROSSMAN, BM [1 ]
机构
[1] COLUMBIA UNIV,DEPT ELECT ENGN,NEW YORK,NY 10027
关键词
D O I
10.1109/TCAD.1985.1270151
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:520 / 526
页数:7
相关论文
共 16 条
[1]  
BANK RE, 1983, IEEE T ELECTRON DEV, V30, P1031, DOI 10.1109/T-ED.1983.21257
[2]   FINITE-ELEMENT ANALYSIS OF SEMICONDUCTOR-DEVICES - THE FIELDAY PROGRAM [J].
BUTURLA, EM ;
COTTRELL, PE ;
GROSSMAN, BM ;
SALSBURG, KA .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1981, 25 (04) :218-231
[3]  
COTTRELL PE, 1976, 10TH AS C CIRC SYST, P135
[4]   TEMPERATURE DEPENDENCE OF AVALANCHE MULTIPLICATION IN SEMICONDUCTORS [J].
CROWELL, CR ;
SZE, SM .
APPLIED PHYSICS LETTERS, 1966, 9 (06) :242-&
[5]   ANIMATION AND 3D COLOR DISPLAY OF MULTIPLE-VARIABLE DATA - APPLICATION TO SEMICONDUCTOR DESIGN [J].
FARRELL, EJ ;
LAUX, SE ;
CORSON, PL ;
BUTURLA, EM .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1985, 29 (03) :302-315
[6]   NUMERICAL-SOLUTION OF THE SEMICONDUCTOR TRANSPORT-EQUATIONS WITH CURRENT BOUNDARY-CONDITIONS [J].
GROSSMAN, BM ;
HARGROVE, MJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (09) :1092-1096
[7]  
GROSSMAN BM, 1984, COMPUT METHOD APPL M, V6, P697
[8]   SEMICONDUCTOR-DEVICE SIMULATION USING GENERALIZED MOBILITY MODELS [J].
LAUX, SE ;
BYRNES, RG .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1985, 29 (03) :289-301
[9]  
LAUX SE, 1984, 1984 INT EL DEV M SA
[10]  
PINTO MR, 1984, 2ND C NUM SIM VLSI D