HYDROGEN IN SEMICONDUCTORS - THE ROLES OF MU-SR AND THEORY

被引:3
作者
ESTREICHER, SK
机构
[1] Physics Department, Texas Tech University, Lubbock, 79409-1051, TX
来源
HYPERFINE INTERACTIONS | 1994年 / 86卷 / 1-4期
关键词
D O I
10.1007/BF02068957
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
Hydrogen is an unavoidable impurity in all semiconductors. It interacts with intrinsic defects (from monovacancies to dislocations), with impurities (shallow dopants, deep centers, even electrically inactive impurities), with the crystal, and with other H interstitials. These interactions profoundly affect the electrical and optical properties of the host. Conventional experimental techniques used to study the properties of hydrogen (EPR, IR or Raman spectroscopy, etc.) have provided information on a number of H-related defects. Theory has played a major role in these studies, not only by confirming the models proposed on the basis of experimental data, but often by explaining the data altogether or predicting new features. So far, muSR has provided fundamental information on isolated hydrogen-like species in many semiconductors. It would be wonderful if the spectroscopic signature of muonium-impurity pairs could be identified or if quantitative information regarding the stability of the various charge states of muonium could be obtained.
引用
收藏
页码:625 / 637
页数:13
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共 72 条
  • [1] ABRAGAM A, 1984, CR ACAD SCI II, V299, P95
  • [2] AMOREBONAPASTA A, 1992, PHYS REV B, V45, P11744
  • [3] STRUCTURE OF ACCEPTOR-HYDROGEN AND DONOR-HYDROGEN COMPLEXES IN SILICON FROM UNIAXIAL-STRESS STUDIES
    BERGMAN, K
    STAVOLA, M
    PEARTON, SJ
    HAYES, T
    [J]. PHYSICAL REVIEW B, 1988, 38 (14): : 9643 - 9648
  • [4] DONOR-HYDROGEN COMPLEXES IN PASSIVATED SILICON
    BERGMAN, K
    STAVOLA, M
    PEARTON, SJ
    LOPATA, J
    [J]. PHYSICAL REVIEW B, 1988, 37 (05): : 2770 - 2773
  • [5] ENHANCED THERMAL DONOR FORMATION IN SILICON EXPOSED TO A HYDROGEN PLASMA
    BROWN, AR
    CLAYBOURN, M
    MURRAY, R
    NANDHRA, PS
    NEWMAN, RC
    TUCKER, JH
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1988, 3 (06) : 591 - 593
  • [6] THEORY OF HYDROGEN PASSIVATION OF SHALLOW-LEVEL DOPANTS IN CRYSTALLINE SILICON
    CHANG, KJ
    CHADI, DJ
    [J]. PHYSICAL REVIEW LETTERS, 1988, 60 (14) : 1422 - 1425
  • [7] HYDROGEN-BONDING AND DIFFUSION IN CRYSTALLINE SILICON
    CHANG, KJ
    CHADI, DJ
    [J]. PHYSICAL REVIEW B, 1989, 40 (17): : 11644 - 11653
  • [8] CHOW KH, UNPUB PHYS REV LETT
  • [9] SIMILARITIES, DIFFERENCES, AND TRENDS IN THE PROPERTIES OF INTERSTITIAL-H IN CUBIC-C, CUBIC-SI, CUBIC-BN, CUBIC-BP, CUBIC-A1P, AND CUBIC-SIC
    CHU, CH
    ESTREICHER, SK
    [J]. PHYSICAL REVIEW B, 1990, 42 (15): : 9486 - 9495
  • [10] MOLECULAR RADICAL MODELS FOR THE MUONIUM CENTERS IN SOLIDS
    COX, SFJ
    SYMONS, MCR
    [J]. CHEMICAL PHYSICS LETTERS, 1986, 126 (06) : 516 - 525