学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
THEORY OF BEAM INDUCED CURRENT CHARACTERIZATION OF GRAIN-BOUNDARIES IN POLYCRYSTALLINE SOLAR-CELLS
被引:159
作者
:
DONOLATO, C
论文数:
0
引用数:
0
h-index:
0
DONOLATO, C
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1983年
/ 54卷
/ 03期
关键词
:
D O I
:
10.1063/1.332205
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1314 / 1322
页数:9
相关论文
共 21 条
[1]
IMPROVED SPATIAL-RESOLUTION DIFFUSION LENGTH MEASUREMENTS IN IMPERFECT SILICON
BELL, RO
论文数:
0
引用数:
0
h-index:
0
BELL, RO
HANOKA, JI
论文数:
0
引用数:
0
h-index:
0
HANOKA, JI
[J].
JOURNAL OF APPLIED PHYSICS,
1982,
53
(03)
: 1741
-
1744
[2]
1ST AND 2ND ORDER TWIN BOUNDARIES IN EDGE DEFINED FILM GROWTH-SILICON RIBBON
CUNNINGHAM, B
论文数:
0
引用数:
0
h-index:
0
CUNNINGHAM, B
STRUNK, H
论文数:
0
引用数:
0
h-index:
0
STRUNK, H
AST, DG
论文数:
0
引用数:
0
h-index:
0
AST, DG
[J].
APPLIED PHYSICS LETTERS,
1982,
40
(03)
: 237
-
239
[3]
ON THE ANALYSIS OF DIFFUSION LENGTH MEASUREMENTS BY SEM
DONOLATO, C
论文数:
0
引用数:
0
h-index:
0
DONOLATO, C
[J].
SOLID-STATE ELECTRONICS,
1982,
25
(11)
: 1077
-
1081
[4]
COMPUTER-SIMULATION OF SEM ELECTRON-BEAM INDUCED CURRENT IMAGES OF DISLOCATIONS AND STACKING-FAULTS
DONOLATO, C
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Festkörperforschung, 7000 Stuttgart 80, Germany
DONOLATO, C
KLANN, H
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Festkörperforschung, 7000 Stuttgart 80, Germany
KLANN, H
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(03)
: 1624
-
1633
[5]
DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS
EVERHART, TE
论文数:
0
引用数:
0
h-index:
0
EVERHART, TE
HOFF, PH
论文数:
0
引用数:
0
h-index:
0
HOFF, PH
[J].
JOURNAL OF APPLIED PHYSICS,
1971,
42
(13)
: 5837
-
&
[6]
Gradshtevn I S, 1980, TABLE INTEGRALS SERI, P307
[7]
HANOKA J, 1979, SOL CELLS, V1, P123
[8]
JUNCTION CURRENT AND LUMINESCENCE NEAR A DISLOCATION OR A SURFACE
LAX, M
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
LAX, M
[J].
JOURNAL OF APPLIED PHYSICS,
1978,
49
(05)
: 2796
-
2810
[9]
SCANNING ELECTRON-MICROSCOPE CHARGE-COLLECTION IMAGES OF GRAIN-BOUNDARIES
MAREK, J
论文数:
0
引用数:
0
h-index:
0
MAREK, J
[J].
JOURNAL OF APPLIED PHYSICS,
1982,
53
(03)
: 1454
-
1460
[10]
GRAIN-BOUNDARY POTENTIAL DETERMINATION IN POLYCRYSTALLINE SILICON BY THE SCANNING LIGHT SPOT TECHNIQUE
MARTINEZ, J
论文数:
0
引用数:
0
h-index:
0
MARTINEZ, J
CRIADO, A
论文数:
0
引用数:
0
h-index:
0
CRIADO, A
PIQUERAS, J
论文数:
0
引用数:
0
h-index:
0
PIQUERAS, J
[J].
JOURNAL OF APPLIED PHYSICS,
1981,
52
(03)
: 1301
-
1305
←
1
2
3
→
共 21 条
[1]
IMPROVED SPATIAL-RESOLUTION DIFFUSION LENGTH MEASUREMENTS IN IMPERFECT SILICON
BELL, RO
论文数:
0
引用数:
0
h-index:
0
BELL, RO
HANOKA, JI
论文数:
0
引用数:
0
h-index:
0
HANOKA, JI
[J].
JOURNAL OF APPLIED PHYSICS,
1982,
53
(03)
: 1741
-
1744
[2]
1ST AND 2ND ORDER TWIN BOUNDARIES IN EDGE DEFINED FILM GROWTH-SILICON RIBBON
CUNNINGHAM, B
论文数:
0
引用数:
0
h-index:
0
CUNNINGHAM, B
STRUNK, H
论文数:
0
引用数:
0
h-index:
0
STRUNK, H
AST, DG
论文数:
0
引用数:
0
h-index:
0
AST, DG
[J].
APPLIED PHYSICS LETTERS,
1982,
40
(03)
: 237
-
239
[3]
ON THE ANALYSIS OF DIFFUSION LENGTH MEASUREMENTS BY SEM
DONOLATO, C
论文数:
0
引用数:
0
h-index:
0
DONOLATO, C
[J].
SOLID-STATE ELECTRONICS,
1982,
25
(11)
: 1077
-
1081
[4]
COMPUTER-SIMULATION OF SEM ELECTRON-BEAM INDUCED CURRENT IMAGES OF DISLOCATIONS AND STACKING-FAULTS
DONOLATO, C
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Festkörperforschung, 7000 Stuttgart 80, Germany
DONOLATO, C
KLANN, H
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Festkörperforschung, 7000 Stuttgart 80, Germany
KLANN, H
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(03)
: 1624
-
1633
[5]
DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS
EVERHART, TE
论文数:
0
引用数:
0
h-index:
0
EVERHART, TE
HOFF, PH
论文数:
0
引用数:
0
h-index:
0
HOFF, PH
[J].
JOURNAL OF APPLIED PHYSICS,
1971,
42
(13)
: 5837
-
&
[6]
Gradshtevn I S, 1980, TABLE INTEGRALS SERI, P307
[7]
HANOKA J, 1979, SOL CELLS, V1, P123
[8]
JUNCTION CURRENT AND LUMINESCENCE NEAR A DISLOCATION OR A SURFACE
LAX, M
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
LAX, M
[J].
JOURNAL OF APPLIED PHYSICS,
1978,
49
(05)
: 2796
-
2810
[9]
SCANNING ELECTRON-MICROSCOPE CHARGE-COLLECTION IMAGES OF GRAIN-BOUNDARIES
MAREK, J
论文数:
0
引用数:
0
h-index:
0
MAREK, J
[J].
JOURNAL OF APPLIED PHYSICS,
1982,
53
(03)
: 1454
-
1460
[10]
GRAIN-BOUNDARY POTENTIAL DETERMINATION IN POLYCRYSTALLINE SILICON BY THE SCANNING LIGHT SPOT TECHNIQUE
MARTINEZ, J
论文数:
0
引用数:
0
h-index:
0
MARTINEZ, J
CRIADO, A
论文数:
0
引用数:
0
h-index:
0
CRIADO, A
PIQUERAS, J
论文数:
0
引用数:
0
h-index:
0
PIQUERAS, J
[J].
JOURNAL OF APPLIED PHYSICS,
1981,
52
(03)
: 1301
-
1305
←
1
2
3
→