DISLOCATION MOBILITY MEASUREMENTS - AN ESSENTIAL TOOL FOR UNDERSTANDING THE ATOMIC AND ELECTRONIC CORE STRUCTURES OF DISLOCATIONS IN SEMICONDUCTORS

被引：10

作者：

LOUCHET, F

GEORGE, A

机构：

[1] CNRS,OPT ELECTR LAB,F-31055 TOULOUSE,FRANCE

[2] ECOLE MINES,CNRS,PHYS SOLIDE LAB,F-54042 NANCY,FRANCE

来源：

JOURNAL DE PHYSIQUE | 1983年 / 44卷 / NC-4期

关键词：

D O I：

10.1051/jphyscol:1983406

中图分类号：

学科分类号：

摘要：

引用

页码：51 / 60

页数：10

共 50 条

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