SURFACE ANALYSIS, PEAK INTENSITIES AND ANGULAR-DISTRIBUTIONS IN XPS

被引：15

作者：

FADLEY, CS ^{[1
]}

机构：

[1] UNIV HAWAII, DEPT CHEM, HONOLULU, HI 96822 USA

来源：

FARADAY DISCUSSIONS | 1975年 / 60卷

关键词：

D O I：

10.1039/dc9756000018

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：18 / 29

页数：12

共 17 条

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[7] SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

FADLEY, CS ;

BAIRD, RJ ;

SIEKHAUS, W ;

NOVAKOV, T ;

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[8] ANGULAR DISTRIBUTION OF PHOTOELECTRONS FROM A METAL SINGLE CRYSTAL [J].

FADLEY, CS ;

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[9] INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS [J].

FADLEY, CS .

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[10]

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