DEVELOPMENT OF A NOVEL LARGE AREA EXCIMER LAMP FOR DIRECT PHOTO DEPOSITION OF THIN-FILMS

被引:29
作者
BERGONZO, P [1 ]
PATEL, P [1 ]
BOYD, IW [1 ]
KOGELSCHATZ, U [1 ]
机构
[1] ASEA BROWN BOVERI CORP RES,CH-5405 BADEN,SWITZERLAND
关键词
D O I
10.1016/0169-4332(92)90081-8
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The desire for low-temperature processing in order to minimize undesirable effects has brought about an extensive use of photochemical vapour deposition (photo-CVD). Photo-enhanced processing is one of the techniques which has received considerable interest. One of the major limitations of photo-processing is the lack of sufficiently intense ultra-violet (UV) sources. In this paper we report the design of a new and intense large area UV lamp based on the dielectric barrier discharge. We shall also discuss the direct (i.e. without intermediate photo-sensitisation reactions) photo-induced deposition of thin silicon dioxide films using SiH4 and N2O which are photo-dissociated by 126 nm photons generated by this variable wavelength excimer lamp.
引用
收藏
页码:424 / 429
页数:6
相关论文
共 18 条
  • [1] BOYD IW, 1987, LASER PROCESSING THI
  • [2] LASER-INDUCED CHEMICAL VAPOR-DEPOSITION OF SIO2
    BOYER, PK
    ROCHE, GA
    RITCHIE, WH
    COLLINS, GJ
    [J]. APPLIED PHYSICS LETTERS, 1982, 40 (08) : 716 - 719
  • [3] TRAPPED POSITIVE CHARGE IN PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITED SILICON DIOXIDE FILMS
    BUCHANAN, DA
    STATHIS, JH
    WAGNER, PR
    [J]. APPLIED PHYSICS LETTERS, 1990, 56 (11) : 1037 - 1039
  • [4] UV EXCIMER RADIATION FROM DIELECTRIC-BARRIER DISCHARGES
    ELIASSON, B
    KOGELSCHATZ, U
    [J]. APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1988, 46 (04): : 299 - 303
  • [5] OZONE SYNTHESIS FROM OXYGEN IN DIELECTRIC BARRIER DISCHARGES
    ELIASSON, B
    HIRTH, M
    KOGELSCHATZ, U
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1987, 20 (11) : 1421 - 1437
  • [6] ELIASSON B, 1988, EUROP PHOTOCHEM ASS, V32, P29
  • [7] GENERATION OF EXCIMER EMISSION IN DIELECTRIC BARRIER DISCHARGES
    GELLERT, B
    KOGELSCHATZ, U
    [J]. APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1991, 52 (01): : 14 - 21
  • [8] Kogelschatz U., 1988, PROCESS TECHNOLOGIES, P87
  • [9] ULTRAVIOLET-OZONE CLEANING OF SILICON SURFACES STUDIED BY AUGER-SPECTROSCOPY
    KRUSOR, BS
    BIEGELSEN, DK
    YINGLING, RD
    ABELSON, JR
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (01): : 129 - 130
  • [10] SILICON DIOXIDE DEPOSITION AT 100-DEGREES-C USING VACUUM ULTRAVIOLET-LIGHT
    MARKS, J
    ROBERTSON, RE
    [J]. APPLIED PHYSICS LETTERS, 1988, 52 (10) : 810 - 812